Personensuche
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Information technology and electrical engineering - devices and systems, materials and technologies for the future / Faculty of Electrical and Information Technology, [Technische Universität Ilmenau. Hrsg.: Peter Scharff]
1
Composition measurements of group-III nitride ternary and q..:
, In:Exemplar:
Zentrale:Magazin 01.R.9827
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Information technology and electrical engineering - devices and systems, materials and technologies for the future / Faculty of Electrical and Information Technology, [Technische Universität Ilmenau. Hrsg.: Peter Scharff]
2
Work function analysis of GaN-based lateral polarity struct..:
, In:Exemplar:
Zentrale:Magazin 01.R.9827
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Information technology and electrical engineering - devices and systems, materials and technologies for the future / Faculty of Electrical and Information Technology, [Technische Universität Ilmenau. Hrsg.: Peter Scharff]
3
SiC-based FET for NOx gas sensing applications using InVOx ..:
, In:Exemplar:
Zentrale:Magazin 01.R.9827
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Information technology and electrical engineering - devices and systems, materials and technologies for the future / Faculty of Electrical and Information Technology, [Technische Universität Ilmenau. Hrsg.: Peter Scharff]
4
Origin of n-type conductivity in nominally undoped InN:
, In:Exemplar:
Zentrale:Magazin 01.R.9827
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Information technology and electrical engineering - devices and systems, materials and technologies for the future / Faculty of Electrical and Information Technology, [Technische Universität Ilmenau. Hrsg.: Peter Scharff]
5
Self organisation and properties of Black Silicon:
, In:Exemplar:
Zentrale:Magazin 01.R.9827