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Aain, Abu Khari Bin
7  Ergebnisse:
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1

Multiple Controlled Antirandom Testing (MCAT) for High Faul..:

Arbab Alamgir ; Abu Khari Bin A'Ain ; Usman Ullah Sheikh...
https://ieeexplore.ieee.org/document/8811467/.  , 2019
Link: https://doi.org/10.1109/..
 
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2

Multiple controlled antirandom testing (MCAT) for high faul..:

Alamgir, Arbab ; Bin A'ain, Abu Khari ; Sheikh, Usman Ullah...
IEEE Access;7, pp. 117246-117257.  , 2019
Link: http://hdl.handle.net/10..
 
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3

Multiple controlled antirandom testing (MCAT) for high faul..:

Arbab Alamgir ; Abu Khari Bin A'ain ; Usman Ullah Sheikh...
10344/8217.  , 2019
Link: https://figshare.com/art..
 
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4

Horizontal diversity in test generation for high fault cove..:

Arbab Alamgir ; Abu Khari Bin A'ain ; Norlina Paraman..
10344/7465.  , 2018
Link: https://figshare.com/art..
 
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5

Horizontal diversity in test generation for high fault cove..:

Alamgir, Arbab ; Bin A'ain, Abu Khari ; Paraman, Norlina..
Turkish Journal of Electrical Engineering & Computer Sciences;26, pp. 3258-3273.  , 2018
Link: http://hdl.handle.net/10..
 
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6

Rail-To-Rail Output Op-Amp Design with Negative Miller Capa..:

Muhaned Zaidi ; Ian Grout ; Abu Khari bin A'ain
doi:10.5281/zenodo.1129190.  , 2017
Link: https://zenodo.org/recor..
 
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7

Using MATLAB in the teaching and learning of semiconductor ..:

Grout, Ian ; Bin A'ain, Abu Khari
ISBN:978-953-51-0752-1.  , 2012
Link: https://mts.intechopen.c..
 
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