Black, William ; Wang, Jun ; Yuan, Xibo Black , W , Wang , J & Yuan , X 2022 , An Integrated Testbed with Single DC Source for Delivering Symmetrical Square-Wave Excitation Voltage in the Triple Pulse Test . in IECON 2022 - 48th Annual Conference of the IEEE Industrial Electronics Society . Annual Conference of Industrial Electronics Society , Institute of Electrical and Electronics Engineers (IEEE) , IECON 2022 - 48th Annual Conference of the IEEE Industrial Electronics Society , Brussels , Belgium , 17/10/22 . https://doi.org/10.1109/IECON49645.2022.9968773.
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2022