Bonneville, D.
1610  Ergebnisse:
Personensuche X
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1

Using in-situ strain measurements to evaluate the accuracy ..:

Guglielmi Y ; McClure M ; Burghardt J...
info:eu-repo/semantics/altIdentifier/wos/WOS:001044036200001.  , 2023
 
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8

Nanometric metrology by FIB-SEM-DIC measurements of strain ..:

Mammadi, Y ; Joseph, A ; Joulain, A...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.matdes.2020.108665.  , 2020
 
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9

Low temperature atomic-scale observations of slip traces in..:

Douat, B ; Bonneville, J ; Drouet, M..
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.scriptamat.2020.03.026.  , 2020
 
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10

Low temperature atomic-scale observations of slip traces in..:

Douat, B ; Bonneville, J ; Drouet, M..
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.scriptamat.2020.03.026.  , 2020
 
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11

Creation of a mixed‐mode fracture network at mesoscale thro..:

Schoenball M ; Ajo-Franklin J. B ; Blankenship D...
info:eu-repo/semantics/altIdentifier/wos/WOS:000603664600006.  , 2020
 
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12

Nanometric metrology by FIB-SEM-DIC measurements of strain ..:

Mammadi, Y ; Joseph, A ; Joulain, A...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.matdes.2020.108665.  , 2020
 
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13

An atomic-scale insight into Ni3Al slip traces:

Coupeau, C ; Michel, J ; Bonneville, J.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mtla.2019.100563.  , 2020
 
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14

Nanometric metrology by FIB-SEM-DIC measurements of strain ..:

Mammadi, Y ; Joseph, A ; Joulain, A...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.matdes.2020.108665.  , 2020
 
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15

Nanometric metrology by FIB-SEM-DIC measurements of strain ..:

Y. Mammadi ; A. Joseph ; A. Joulain...
http://www.sciencedirect.com/science/article/pii/S0264127520301994.  , 2020
 
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