Marinissen, Erik Jan ;
Zorian, Yervant ;
Konijnenburg, Mario...
Marinissen , E J , Zorian , Y , Konijnenburg , M , Huang , C-T , Hsieh , P-H , Cockburn , P , Delvaux , J , Rozic , V , Yang , B , Singelee , D , Verbauwhede , I , Mayor , C , Van Rijsinge , R & Reyes , C 2016 , IoT: source of test challenges . in Proceedings - 2016 21st IEEE European Test Symposium, ETS 2016 . , 7519331 , Institute of Electrical and Electronics Engineers , Piscataway , 21st IEEE European Test Symposium (ETS 2016) , Amsterdam , Netherlands , 23/05/16 . https://doi.org/10.1109/ETS.2016.7519331.
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2016