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Miyamura, Yoshiji
7  Ergebnisse:
OpenAccess-Volltexte X
Personensuche X
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1

Evaluation of defects generation in crystalline silicon ing..:

Tachibana, Tomihisa ; Sameshima, Takashi ; Kojima, Takuto...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC3331869.  , 2012
Link: http://www.ncbi.nlm.nih...
 
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2

3D Numerical Analysis of the Asymmetric Three-Phase Line of..:

Xue-Feng Han ; Xin Liu ; Satoshi Nakano...
https://www.mdpi.com/2073-4352/10/2/121.  , 2020
Link: https://doi.org/10.3390/..
 
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3

3D Numerical Analysis of the Asymmetric Three-Phase Line of..:

Xue-Feng Han ; Xin Liu ; Satoshi Nakano...
https://dx.doi.org/10.3390/cryst10020121.  , 2020
Link: https://doi.org/10.3390/..
 
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4

Relationship between Dislocation Density and Oxygen Concent..:

Tomoro Ide ; Hirofumi Harada ; Yoshiji Miyamura...
http://www.mdpi.com/2073-4352/8/6/244.  , 2018
Link: https://doi.org/10.3390/..
 
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5

Relationship between Dislocation Density and Oxygen Concent..:

Tomoro Ide ; Hirofumi Harada ; Yoshiji Miyamura...
https://dx.doi.org/10.3390/cryst8060244.  , 2018
Link: https://doi.org/10.3390/..
 
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6

Single-Seed Casting Large-Size Monocrystalline Silicon for ..:

Bing Gao ; Satoshi Nakano ; Hirofumi Harada...
http://www.sciencedirect.com/science/article/pii/S2095809916300169.  , 2015
Link: https://doi.org/10.15302..
 
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7

Numerical Analysis of the Dislocation Density in Multicryst..:

Makoto Inoue ; Satoshi Nakano ; Hirofumi Harada...
http://dx.doi.org/10.1155/2013/706923.  , 2013
Link: https://doi.org/10.1155/..
 
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