Moens, P ;
Banerjee, A ;
Uren, Michael...
Moens , P , Banerjee , A , Uren , M , Meneghini , M , Karboyan , S , Chatterjee , I , Vanmeerbeek , P , Caesar , M , Liu , C , Salih , A , Zanoni , E , Meneghesso , G , Kuball , M & Tack , M 2016 , Impact of buffer leakage on intrinsic reliability of 650V AlGaN/GaN HEMTs . in 2015 IEEE International Electron Devices Meeting (IEDM 2015) : Proceedings of a meeting held 7-9 December 2015, Washington, DC, USA . Institute of Electrical and Electronics Engineers (IEEE) , pp. 35.2.1-35.2.4 , 61st IEEE International Electron Devices Meeting, IEDM 2015 , Washington , United States , 7/12/15 . https://doi.org/10.1109/IEDM.2015.7409831.
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