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Phan, Nguyen Duy Minh
188  Ergebnisse:
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1

Disinfection performance of an ultraviolet lamp: a CFD inve..:

Bui, Cuong Mai ; Phan, Nguyen Duy Minh ; Tran, Ngo Quoc Huy...
https://ojs.cvut.cz/ojs/index.php/ap/article/view/7627/6399.  , 2022
Link: https://ojs.cvut.cz/ojs/..
 
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2

Disinfection performance of an ultraviolet lamp: a CFD inve..:

Bui, Cuong Mai ; Phan, Nguyen Duy Minh ; Tran, Ngo Quoc Huy...
Acta Polytechnica.  , 2022
Link: http://hdl.handle.net/10..
 
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3

Trajectoire de numérisation pour mesure On-Machine sur MOCN..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lartigue, Claire
hal-02093360.  , 2019
Link: https://hal.archives-ouv..
 
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4

Trajectoires de numérisation adaptatives en contexte in-sit..:

Phan, Nguyen Duy Minh
http://www.theses.fr/2019SACLN005/document.  , 2019
Link: http://www.theses.fr/201..
 
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5

Adaptive scanning strategies for on-machine part inspection..:

Phan, Nguyen Duy Minh
NNT: 2019SACLN005.  , 2019
Link: https://tel.archives-ouv..
 
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6

Adaptive scanning strategies for on-machine part inspection..:

Phan, Nguyen Duy Minh
NNT: 2019SACLN005.  , 2019
Link: https://theses.hal.scien..
 
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7

Trajectoire de numérisation pour mesure On-Machine sur MOCN..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lartigue, Claire
hal-02093360.  , 2019
Link: https://hal.science/hal-..
 
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8

Optimal scanning strategy for on-machine inspection with la..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lartigue, Claire
info:eu-repo/semantics/altIdentifier/doi/10.1007/s00170-019-03877-x.  , 2019
Link: https://hal.science/hal-..
 
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9

Optimal scanning strategy for on-machine inspection with la..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lartigue, Claire
info:eu-repo/semantics/altIdentifier/doi/10.1007/s00170-019-03877-x.  , 2019
Link: https://hal.archives-ouv..
 
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10

Scanner path planning with the control of overlap for part ..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lavernhe, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1007/s00170-018-2336-8.  , 2018
Link: https://hal.science/hal-..
 
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11

Defining scanning trajectory for on-machine inspection usin..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lartigue, Claire
info:eu-repo/semantics/altIdentifier/doi/10.1007/978-3-030-12346-8_34.  , 2018
Link: https://hal.archives-ouv..
 
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12

Defining scanning trajectory for on-machine inspection usin..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lartigue, Claire
info:eu-repo/semantics/altIdentifier/doi/10.1007/978-3-030-12346-8_34.  , 2018
Link: https://hal.science/hal-..
 
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13

Scanner path planning with the control of overlap for part ..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lavernhe, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1007/s00170-018-2336-8.  , 2018
Link: https://hal.archives-ouv..
 
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14

Path planning of a laser-scanner with the control of overla..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lavernhe, Sylvain.
hal-01654044.  , 2017
Link: https://hal.science/hal-..
 
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15

Path planning of a laser-scanner with the control of overla..:

Phan, Nguyen Duy Minh ; Quinsat, Yann ; Lavernhe, Sylvain.
hal-01654044.  , 2017
Link: https://hal.archives-ouv..
 
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