Weatherford, T.
53  Ergebnisse:
Personensuche X
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3

Single event upsets in gallium arsenide dynamic logic:

Fouts, D.J ; Weatherford, T ; McMorrow, C..
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States); Journal Volume: 41:6Pt1; Conference: 31. annual international nuclear and space radiation effects conference, Tucson, AZ (United States), 18-22 Jul 1994.  , 1994
 
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5

Utilizing Low-Dose Transmission Electron Microscopy for Str..:

Specht, Petra ; Luysberg, Martina ; Chavez1, J...
Specht, Petra, et al. "Utilizing Low-Dose Transmission Electron Microscopy for Structure and Defect Identification in Group III-Nitride Electronic Devices." Microscopy and Microanalysis 24.S1 (2018): 1972-1973..  , 2018
 
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8

Single Event Induced Voltage Transients within lnP HBT Circ..:

Weatherford, T.R ; Whitaker, J ; Meyer, S...
Weatherford, T. R., et al. "Single event induced voltage transients within InP HBT circuits." Government Microcircuit Applications Conference (GOMAC 2000), Digest of Papers. 2000..  , 2000
 
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11

SEU design consideration for MESFETs on LT GaAs:

Weatherford, T.R ; Radice, R ; Eskins, D...
Journal Name: IEEE Transactions on Nuclear Science; Journal Volume: 44; Journal Issue: 6Pt1; Conference: 34. IEEE nuclear and space radiation effects conference, Snowmass, CO (United States), 21-25 Jul 1997; Other Information: PBD: Dec 1997.  , 1997
 
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12

Effects of low-temperature buffer-layer thickness and growt..:

Weatherford, T.R ; Marshall, P.W ; Marshall, C.J...
IEEE Transactions on Nuclear Science, V. 44, No. 6, pp. 2298-2305, December 1997.  , 1997
 
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15

Single event upsets in gallium arsenide pseudo-complementar..:

Fouts, D.J ; Wolfe, K ; Van Dyk, S.E...
Journal Name: IEEE Transactions on Nuclear Science; Journal Volume: 42; Journal Issue: 6Pt1; Conference: 32. annual IEEE international nuclear and space radiation effects conference, Madison, WI (United States), 17-21 Jul 1995; Other Information: PBD: Dec 1995.  , 1995
 
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