Østerberg, Frederik W
131  Ergebnisse:
Personensuche X
?
1

Review of Micro- and Nanoprobe Metrology for Direct Electri..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),
 
?
 
?
4

Electrical Homogeneity Mapping of Epitaxial Graphene on Sil..:

Whelan, Patrick R. ; Panchal, Vishal ; Petersen, Dirch H....
ACS Applied Materials & Interfaces.  10 (2018)  37 - p. 31641-31647 , 2018
 
?
 
?
 
?
10

On-chip magnetic bead-based DNA melting curve analysis usin..:

Rizzi, Giovanni ; Østerberg, Frederik W. ; Henriksen, Anders D...
Journal of Magnetism and Magnetic Materials.  380 (2015)  - p. 215-220 , 2015
 
?
13

Case studies of electrical characterisation of graphene by ..:

Whelan, Patrick R ; Zhou, Binbin ; Bezencenet, Odile...
https://orbit.dtu.dk/en/publications/adb6ac10-2ddc-4d58-bcd5-03b2ae1db223.  , 2021
 
?
15

3 ω correction method for eliminating resistance measuremen..:

Guralnik, Benny ; Hansen, Ole ; Henrichsen, Henrik H...
Guralnik , B , Hansen , O , Henrichsen , H H , Beltrán-Pitarch , B , Østerberg , F W , Shiv , L , Marangoni , T A , Stilling-Andersen , A R , Cagliani , A , Hansen , M F , Nielsen , P F , Oprins , H , Vermeersch , B , Adelmann , C , Dutta , S , Borup , K A , Mihiretie , B M & Petersen , D H 2021 , ' 3 ω correction method for eliminating resistance measurement error due to Joule heating ' , Review of Scientific Instruments , vol. 92 , no. 9 , 094711 . https://doi.org/10.1063/5.0063998.  , 2021
 
1-15