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Aabrar, Akif
20  Ergebnisse:
Personensuche X
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1

Pulsed Current-Voltage Protocol to Reveal Polarization-Cont..:

, In: 2022 Device Research Conference (DRC),
Hossain, Mir Muntasir ; Pandey, Pratyush ; Aabrar, Akif... - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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2

MAX Phase Ti2AlN for HfO2 Memristors with Ultra‐Low Reset C..:

Athena, Fabia F. ; Nnaji, Moses ; Vaca, Diego...
Advanced Functional Materials.  34 (2024)  29 - p. , 2024
Link: https://doi.org/10.1002/..
 
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3

Comprehensive Time Dependent Dielectric Breakdown (TDDB) Ch..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Ravikumar, Priyankka Gundlapudi ; Ravindran, Prasanna Venkatesan ; Aabrar, Khandker Akif... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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4

Analyzing Total-Ionizing-Dose Induced Memory Window Degrada..:

Woo, Sola ; Aabrar, Khandker Akif ; Datta, Suman.
IEEE Transactions on Device and Materials Reliability.  24 (2024)  1 - p. 84-88 , 2024
Link: https://doi.org/10.1109/..
 
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5

Impact of Device Geometry, Physical Doping and Electrostati..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Palmieri, Andrea ; Cherkaoui, Karim ; Aabrar, Khandker Akif... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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6

Low-Frequency Noise Characteristics of Ferroelectric Field-..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Phadke, Omkar ; Aabrar, Khandker Akif ; Luo, Yuan-chun... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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7

BEOL Compatible Oxide Power Transistors for On- Chip Voltag..:

, In: 2023 International Electron Devices Meeting (IEDM),
Deng, Sunbin ; Kwak, Jungyoun ; Lee, Junmo... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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8

Improved Reliability and Enhanced Performance in BEOL Compa..:

, In: 2023 International Electron Devices Meeting (IEDM),
Aabrar, Khandker Akif ; Gopal Kirtania, Sharadindu ; Deng, Sunbin... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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9

Quantitative Electrostatic Potential Mapping in Dense Polyc..:

Durham, Daniel B ; Aabrar, Khandker Akif ; Ravindran, Prasanna Venkatesan...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 280-281 , 2023
Link: https://doi.org/10.1093/..
 
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10

On the Dopant, Defect States, and Mobility in W Doped Amorp..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Hu, Yaoqiao ; Aabrar, Khandker Akif ; Palmieri, Andrea... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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11

Cold-FeFET as Embedded Non-Volatile Memory with Unlimited C..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Kirtania, Sharadindu Gopal ; Aabrar, Khandker Akif ; Khan, Asif I... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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12

Total Ionizing Dose Effect in Tri-gate Silicon Ferroelectri..:

, In: 2022 International Electron Devices Meeting (IEDM),
Aabrar, Khandker Akif ; Read, James ; Kirtania, Sharadindu Gopal... - p. 32.7.1-32.7.4 , 2022
Link: https://doi.org/10.1109/..
 
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13

Large Injection Velocities in Highly Scaled, Fully Depleted..:

Liao, Yu-Hung ; Aabrar, Khandker Akif ; Chakraborty, Wriddhi...
IEEE Electron Device Letters.  43 (2022)  2 - p. 184-187 , 2022
Link: https://doi.org/10.1109/..
 
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14

Theoretical and Empirical Insight into Dopant, Mobility and..:

, In: 2022 International Electron Devices Meeting (IEDM),
Hu, Yaoqiao ; Ye, Huacheng ; Aabrar, Khandker Akif... - p. 8.5.1-8.5.4 , 2022
Link: https://doi.org/10.1109/..
 
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15

Characterization and Modeling of 22 nm FDSOI Cryogenic RF C..:

Chakraborty, Wriddhi ; Aabrar, Khandker Akif ; Gomez, Jorge...
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits.  7 (2021)  2 - p. 184-192 , 2021
Link: https://doi.org/10.1109/..
 
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