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Acero Leal, María Cruz
43  Ergebnisse:
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1

Physical characterization of filamentary structures in TiN/..:

Poblador, Samuel ; Maestro, Marcos ; Acero Leal, María Cruz..
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2018
Link: http://hdl.handle.net/10..
 
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2

Effect of Resistive Switching Cycling on the Physical Chara..:

Muñoz-Gorriz, J ; Acero Leal, María Cruz ; González, M. B..
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2018
Link: http://hdl.handle.net/10..
 
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3

Assessment of resistive switching characteristics on differ..:

Maestro, Marcos ; Poblador, Samuel ; Zabala, Miguel...
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2018
Link: http://hdl.handle.net/10..
 
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4

Electrical characterization and resistive switching behavio..:

Maestro, Marcos ; Poblador, Samuel ; Zabala, Miguel...
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2018
Link: http://hdl.handle.net/10..
 
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5

Electrical characterization of defects created by ¿-radiati..:

García, Héctor ; Castán, H ; Dueñas, S...
Sí.  , 2017
Link: http://hdl.handle.net/10..
 
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6

Investigation of the multilevel capability of TiN/Ti/HfO2/W..:

González, M. B ; Poblador, Samuel ; Mallol, M. M...
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2017
Link: http://hdl.handle.net/10..
 
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7

Electrical characterization of TiN/Ti/HfO2/W resistive swit..:

Poblador, Samuel ; Acero Leal, María Cruz ; Mallol, M. M..
Sí.  , 2017
Link: http://hdl.handle.net/10..
 
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8

Exploring the Multilevel Capabiblity of TIN/Ti/HfO2/W RRAM ..:

González, M. B ; Acero Leal, María Cruz ; Calvo Angos, José..
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2016
Link: http://hdl.handle.net/10..
 
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9

Investigation of the resistive switching behavior in Ni/HfO..:

González, M. B ; Acero Leal, María Cruz ; Beldarrain, O..
http://dx.doi.org/10.1109/CDE.2015.7087499.  , 2015
Link: http://hdl.handle.net/10..
 
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10

Effect of the blistering of ALD Al2O3 films on the silicon ..:

Acero Leal, María Cruz ; Beldarrain, O ; Duch, M...
http://dx.doi.org/10.1109/CDE.2015.7087443.  , 2015
Link: http://hdl.handle.net/10..
 
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11

Dedicated Random Telegraph Noise Characterization of Ni/HfO..:

González, M. B ; Martín-Martínez, Javier ; Rodríguez, Rosana...
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2015
Link: http://hdl.handle.net/10..
 
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12

Dedicated random telegraph noise characterization of Ni/HfO..:

Bargallo Gonzalez, Mireia ; Martin Martinez, Javier ; Rodríguez Martínez, Rosana...
Ministerio de Economía y Competitividad TEC2011-27292-C02-02.  , 2015
Link: https://ddd.uab.cat/reco..
 
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13

Blistering of ALD Al2O3 films in Al-Al2O3-Si structures:

Campabadal, Francesca ; Acero Leal, María Cruz ; Beldarrain, O...
Sí.  , 2015
Link: http://hdl.handle.net/10..
 
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14

Dispositivo para generar energía eléctrica a partir de pequ..:

Esteve i Tintó, Jaume ; Acero Leal, María Cruz ; Fondevilla Sala, Nuria..
ES2377656 B1 (2013-06-02).  , 2012
Link: http://hdl.handle.net/10..
 
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15

Comparison between Al2O3 thin films grown by ALD using H2O ..:

Campabadal, Francesca ; Beldarrain, O ; Zabala, Miguel..
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2011
Link: http://hdl.handle.net/10..
 
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