E-LIB Suche - Ergebnisse für: Acosta-Alba, Pablo

1

Atomistic Insights into Ultrafast SiGe Nanoprocessing:

Calogero, Gaetano ; Raciti, Domenica ; Ricciarelli, Damiano...
The Journal of Physical Chemistry C. 127 (2023) 39 - p. 19867-19877 , 2023

Link: https://doi.org/10.1021/..

2

Surface-Localized 15R Formation on 4H-SiC (0001) Si-Face by..:

Rozé, Fabien ; Tabata, Toshiyuki ; Kerdilès, Sébastien...
Solid State Phenomena. 342 (2023) - p. 79-83 , 2023

Link: https://doi.org/10.4028/..

3

Impact of surface reflectivity on the ultra-fast laser melt..:

Ricciarelli, Damiano ; Mannino, Giovanni ; Deretzis, Ioannis...
Materials Science in Semiconductor Processing. 165 (2023) - p. 107635 , 2023

Link: https://doi.org/10.1016/..

4

Multiscale modeling of ultrafast melting phenomena:

Calogero, Gaetano ; Raciti, Domenica ; Acosta-Alba, Pablo...
npj Computational Materials. 8 (2022) 1 - p. , 2022

Link: https://doi.org/10.1038/..

5

SiGe-enhanced Si capacitive modulator integration in a 300 ..:

Douix, Maurin ; Perez-Galacho, Diego ; Charlet, Ismael...
Optics Express. 27 (2019) 13 - p. 17701 , 2019

Link: https://doi.org/10.1364/..

6

Ultraviolet Nanosecond Laser Annealing for Low Temperature ..:

Kerdilès, Sébastien ; Acosta-Alba, Pablo ; Royet, Anne-Sophie...
ECS Transactions. 93 (2019) 1 - p. 19-22 , 2019

Link: https://doi.org/10.1149/..

7

Composition and Strain Evolution of Undoped Si0.8Ge0.2 Laye..:

Dagault, Lea ; Acosta-Alba, Pablo ; Kerdilès, Sébastien...
ECS Transactions. 86 (2018) 7 - p. 29-39 , 2018

Link: https://doi.org/10.1149/..

8

Low loss poly-silicon for high performance capacitive silic..:

Douix, Maurin ; Baudot, Charles ; Marris-Morini, Delphine...
Optics Express. 26 (2018) 5 - p. 5983 , 2018

Link: https://doi.org/10.1364/..

9

(Invited) Sequential 3D Process Integration: Opportunities ..:

Kerdilès, Sébastien ; Acosta-Alba, Pablo ; Mathieu, Benoit...
ECS Transactions. 80 (2017) 4 - p. 215-225 , 2017

Link: https://doi.org/10.1149/..

10

Surface self-diffusion of silicon during high temperature a..:

Acosta-Alba, Pablo E. ; Kononchuk, Oleg ; Gourdel, Christophe.
Journal of Applied Physics. 115 (2014) 13 - p. , 2014

Link: https://doi.org/10.1063/..

11

Atomic Scale Thickness Control of SOI Wafers for Fully Depl..:

Schwarzenbach, Walter ; Daval, Nicolas ; Barec, Vincent...
ECS Transactions. 53 (2013) 5 - p. 39-46 , 2013

Link: https://doi.org/10.1149/..

12

Multi-Scale Thickness and Roughness Characterization of Thi..:

Acosta-Alba, Pablo E. ; Kononchuk, Oleg ; Riou, Grégory...
ECS Journal of Solid State Science and Technology. 2 (2013) 9 - p. P357-P361 , 2013

Link: https://doi.org/10.1149/..

13

Defect Engineering for Enhanced Silicon Radiofrequency Subs..:

Perrosé, Martin ; Baron, Yoann ; Lefaucher, Baptiste..
physica status solidi (a). , 2024

Link: https://doi.org/10.1002/..

14

Nanosecond Laser Irradiation for Interface Bonding Characte..:

Larrey, Vincent ; Arribehaute, Arthur ; Caulfield, Brendon...
ECS Transactions. 112 (2023) 3 - p. 39-49 , 2023

Link: https://doi.org/10.1149/..

15

Atomistic insights into ultrafast SiGe nanoprocessing:

Calogero, Gaetano ; Raciti, Domenica ; Ricciarelli, Damiano...
http://arxiv.org/abs/2309.02909. , 2023

Link: http://arxiv.org/abs/230..