Added, Nemitala
32  Ergebnisse:
Personensuche X
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1

Heavy Ion-Induced Faults on Programmable UART Controllers E..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
 
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2

Reliability Assessment of Arm Cortex-M Processors under Hea..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
 
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6

Alpha Particle- and Neutron-Induced Single-Event Effects in..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
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9

Testing a Fault Tolerant Mixed-Signal Design Under TID and ..:

Gonzalez, Carlos J ; Machado, Diego ; Vaz, Rafael G...
Journal of Integrated Circuits and Systems.  16 (2021)  3 - p. 1-11 , 2021
 
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11

Combined ionizing radiation & electromagnetic interference ..:

Goerl, Roger ; Villa, Paulo ; Vargas, Fabian L....
Microelectronics Reliability.  100-101 (2019)  - p. 113341 , 2019
 
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12

Heavy Ions Testing of an All-Convolutional Neural Network f..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
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13

Analyzing the Influence of using Reconfiguration Memory Scr..:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
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14

External-RBS, PIXE and NRA analysis for ancient swords:

Santos, Hellen C. ; Added, Nemitala ; Silva, Tiago F..
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  345 (2015)  - p. 42-47 , 2015
 
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