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2024 IEEE 25th Latin American Test Symposium (LATS) ,
1
Heavy Ion-Induced Faults on Programmable UART Controllers E..:
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2024 IEEE 25th Latin American Test Symposium (LATS) ,
2
Reliability Assessment of Arm Cortex-M Processors under Hea..:
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2024 IEEE Aerospace Conference ,
3
Latching Current Limiter SEE Susceptibility from Heavy Ions:
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2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
6
Alpha Particle- and Neutron-Induced Single-Event Effects in..:
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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
12
Heavy Ions Testing of an All-Convolutional Neural Network f..:
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2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
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