E-LIB Suche - Ergebnisse für: Ahn, Byung Du

1

P‐30: Thermally Activated and Field‐Enhanced Diffusion of D..:

Ryoo, Chang Il ; Yang, Tae Jun ; Lee, Hee Jun...
SID Symposium Digest of Technical Papers. 53 (2022) 1 - p. 1149-1152 , 2022

Link: https://doi.org/10.1002/..

2

Modification of the electronic structure and the electrical..:

Park, Hyun-Woo ; Choi, Min-Jun ; Chung, Kwun-Bum...
Journal of the Korean Physical Society. 68 (2016) 2 - p. 190-194 , 2016

Link: https://doi.org/10.3938/..

3

Study on the Photoresponse of Amorphous In–Ga–Zn–O and Zinc..:

Jang, Jun Tae ; Park, Jozeph ; Ahn, Byung Du...
ACS Applied Materials & Interfaces. 7 (2015) 28 - p. 15570-15577 , 2015

Link: https://doi.org/10.1021/..

4

Hydrogen Bistability as the Origin of Photo‐Bias‐Thermal In..:

Kang, Youngho ; Ahn, Byung Du ; Song, Ji Hun...
Advanced Electronic Materials. 1 (2015) 7 - p. , 2015

Link: https://doi.org/10.1002/..

5

Effect of direct current sputtering power on the behavior o..:

Jang, Jun Tae ; Park, Jozeph ; Ahn, Byung Du...
Applied Physics Letters. 106 (2015) 12 - p. , 2015

Link: https://doi.org/10.1063/..

6

The effect of nitrogen incorporation in Ge–In–Ga–O semicond..:

Ahn, Byung Du ; Lee, Kwang Ho ; Park, Jozeph.
Applied Surface Science. 355 (2015) - p. 1267-1271 , 2015

Link: https://doi.org/10.1016/..

7

A review on the recent developments of solution processes f..:

Ahn, Byung Du ; Jeon, Hye-Ji ; Sheng, Jiazhen..
Semiconductor Science and Technology. 30 (2015) 6 - p. 064001 , 2015

Link: https://doi.org/10.1088/..

8

Facile fabrication of high-performance InGaZnO thin film tr..:

Ahn, Byung Du ; Park, Jin-Seong ; Chung, K. B.
Applied Physics Letters. 105 (2014) 16 - p. , 2014

Link: https://doi.org/10.1063/..

9

Effects of Ga:N Addition on the Electrical Performance of Z..:

Ahn, Byung Du ; Jeon, Hye Ji ; Park, Jin-Seong
ACS Applied Materials & Interfaces. 6 (2014) 12 - p. 9228-9235 , 2014

Link: https://doi.org/10.1021/..

10

Improvement of Negative Bias Temperature Illumination Stabi..:

Ahn, Byung Du ; Kim, Hyun-Suk ; Yun, Dong-Jin..
ECS Journal of Solid State Science and Technology. 3 (2014) 5 - p. Q95-Q98 , 2014

Link: https://doi.org/10.1149/..

11

Investigation on the negative bias illumination stress-indu..:

Jang, Jaeman ; Kim, Dae Geun ; Kim, Dong Myong...
Applied Physics Letters. 105 (2014) 15 - p. , 2014

Link: https://doi.org/10.1063/..

12

Enhanced Electrical Characteristics and Stability via Simul..:

Tak, Young Jun ; Yoon, Doo Hyun ; Yoon, Seokhyun...
ACS Applied Materials & Interfaces. 6 (2014) 9 - p. 6399-6405 , 2014

Link: https://doi.org/10.1021/..

13

Study of Nitrogen High-Pressure Annealing on InGaZnO Thin-F..:

Yoon, Seokhyun ; Tak, Young Jun ; Yoon, Doo Hyun...
ACS Applied Materials & Interfaces. 6 (2014) 16 - p. 13496-13501 , 2014

Link: https://doi.org/10.1021/..

14

Origin of electrical improvement of amorphous TaInZnO TFT b..:

Ahn, Byung Du ; Rim, You Seung ; Kim, Hyun Jae...
Journal of Physics D: Applied Physics. 47 (2014) 10 - p. 105104 , 2014

Link: https://doi.org/10.1088/..

15

Effect of processing temperature on the structural, electro..:

Lim, Jun Hyung ; Choi, Jun Hyuk ; Lee, Seung Muk...
Journal of Physics D: Applied Physics. 47 (2014) 8 - p. 085103 , 2014

Link: https://doi.org/10.1088/..