Alem, Nasim
184  Ergebnisse:
Personensuche X
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4

Characterization of High Entropy Oxide Thin Films by High-R..:

Ayyagari, Sai Venkata Gayathri ; Miao, Leixin ; Webb, Matthew..
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 1768-1769 , 2023
 
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5

Determination of Local Electronic Structure and Optical Res..:

Alem, Nasim ; Bachu, Saiphaneendra ; Woo, Steffi Y...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 390-391 , 2023
 
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7

High Resolution Scanning Transmission Electron Microscopy (..:

Balog, Andrew R ; Miao, Leixin ; Bachu, Saiphaneendra...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 1779-1780 , 2023
 
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9

Layered Semiconductor Cr0.32Ga0.68Te2.33 with Concurrent Br..:

Guan, Yingdong ; Miao, Leixin ; He, Jingyang...
Journal of the American Chemical Society.  145 (2023)  8 - p. 4683-4690 , 2023
 
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10

Degradation of β-Ga2O3 Vertical Ni/Au Schottky Diodes Under..:

Sun, Rujun ; Balog, Andrew R. ; Yang, Haobo..
IEEE Electron Device Letters.  44 (2023)  5 - p. 725-728 , 2023
 
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13

Correction to "Layered Semiconductor Cr0.32Ga0.68Te2.33 wit..:

Guan, Yingdong ; Miao, Leixin ; He, Jingyang...
Journal of the American Chemical Society.  145 (2023)  39 - p. 21696-21696 , 2023
 
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