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Aliev, V.Sh.
2703  Ergebnisse:
Personensuche X
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1

EPM '89: 3rd International Conference on Energy Pulse and P.. 

Physical Research ; 13
Ageev, V ; Akchulakov, M. T ; Albert, M... - Reprint 2021 . , [2022]
Link: https://doi.org/10.1515/..
 
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2

Synchrotron-Excited Luminescence and Converting of Defects ..:

Pustovarov, V.A. ; Zatsepin, A.F. ; Biryukov, D.Yu....
Journal of Non-Crystalline Solids.  602 (2023)  - p. 122077 , 2023
Link: https://doi.org/10.1016/..
 
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3

Resistive Switching Effect in TaN/HfOx/Ni Memristors with a..:

Voronkovskii, V. A. ; Gerasimova, A. K. ; Aliev, V. Sh.
JETP Letters.  117 (2023)  7 - p. 546-550 , 2023
Link: https://doi.org/10.1134/..
 
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4

Forming-Free Memristors Based on Hafnium Oxide Processed in..:

Perevalov, T. V. ; Iskhakzai, R. M. Kh. ; Prosvirin, I. P...
JETP Letters.  115 (2022)  2 - p. 79-83 , 2022
Link: https://doi.org/10.1134/..
 
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5

Charge Transport in Nonstoichiometric SiOx Obtained by Trea..:

Iskhakzay, R. M. Kh. ; Kruchinin, V. N. ; Aliev, V. Sh....
Russian Microelectronics.  51 (2022)  1 - p. 24-35 , 2022
Link: https://doi.org/10.1134/..
 
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6

Comparative study of electron-beam crystallization of amorp..:

Gerasimova, A. K. ; Aliev, V. Sh. ; Krivyakin, G. K..
SN Applied Sciences.  2 (2020)  7 - p. , 2020
Link: https://doi.org/10.1007/..
 
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7

Phonon-assisted electron tunneling between traps in silicon..:

Voronkovskii, V.A. ; Perevalov, T.V. ; Iskhakzay, R.M.H....
Journal of Non-Crystalline Solids.  546 (2020)  - p. 120256 , 2020
Link: https://doi.org/10.1016/..
 
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8

Atomic and Electronic Structure of SiOx Films Obtained with..:

Perevalov, T. V. ; Iskhakzai, R. M. Kh. ; Aliev, V. Sh...
Journal of Experimental and Theoretical Physics.  131 (2020)  6 - p. 940-944 , 2020
Link: https://doi.org/10.1134/..
 
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9

Optical Properties of the SiOx (x < 2) Thin Films Obtained ..:

Kruchinin, V. N. ; Perevalov, T. V. ; Aliev, V. Sh....
Optics and Spectroscopy.  128 (2020)  10 - p. 1577-1582 , 2020
Link: https://doi.org/10.1134/..
 
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10

Optical Properties of Nonstoichiometric Tantalum Oxide TaOx..:

Kruchinin, V. N. ; Volodin, V. A. ; Perevalov, T. V....
Optics and Spectroscopy.  124 (2018)  6 - p. 808-813 , 2018
Link: https://doi.org/10.1134/..
 
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11

VO2 film temperature dynamics at low-frequency current self..:

Bortnikov, S. G. ; Aliev, V. Sh. ; Badmaeva, I. A..
Journal of Applied Physics.  123 (2018)  7 - p. , 2018
Link: https://doi.org/10.1063/..
 
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12

List of Contributors:

, In: Advances in Semiconductor Nanostructures,
Akhundov, I.O. ; Aliev, V.Sh. ; Alperovich, V.L.... - p. xv-xxi , 2017
Link: https://doi.org/10.1016/..
 
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13

The Nature of Defects Responsible for Transport in a Hafnia..:

, In: Advances in Semiconductor Nanostructures,
Islamov, D.R. ; Perevalov, T.V. ; Gritsenko, V.A.... - p. 493-504 , 2017
Link: https://doi.org/10.1016/..
 
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14

Optical properties of nonstoichiometric ZrO x according to ..:

Kruchinin, V. N. ; Aliev, V. Sh. ; Gerasimova, A. K..
Optics and Spectroscopy.  121 (2016)  2 - p. 241-245 , 2016
Link: https://doi.org/10.1134/..
 
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15

Cathodo- and photoluminescence increase in amorphous hafniu..:

Ivanova, E. V. ; Zamoryanskaya, M. V. ; Pustovarov, V. A....
Journal of Experimental and Theoretical Physics.  120 (2015)  4 - p. 710-715 , 2015
Link: https://doi.org/10.1134/..
 
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