E-LIB Suche - Ergebnisse für: Alquier, Daniel

1

Study of Leakage Current Transport Mechanisms in Pseudo-Ver..:

El Amrani, Mohammed ; Buckley, Julien ; Kaltsounis, Thomas...
Crystals. 14 (2024) 6 - p. 553 , 2024

Link: https://doi.org/10.3390/..

2

Optimisation of Negative Fixed Charge Based Edge Terminatio..:

Maurya, Vishwajeet ; Alquier, Daniel ; El Amrani, Mohammed..
Micromachines. 15 (2024) 6 - p. 719 , 2024

Link: https://doi.org/10.3390/..

3

Silicon-carbide-based MEMS for gas detection applications:

Michaud, Jean-François ; Portail, Marc ; Alquier, Daniel..
Materials Science in Semiconductor Processing. 171 (2024) - p. 107986 , 2024

Link: https://doi.org/10.1016/..

4

How to Accurately Determine the Ohmic Contact Properties on..:

Berger, Clément ; Alquier, Daniel ; Michaud, Jean-François
Electronics. 13 (2024) 1 - p. 217 , 2024

Link: https://doi.org/10.3390/..

5

Highlighting the role of 3C–SiC in the performance optimiza..:

Bah, Micka ; Alquier, Daniel ; Lesecq, Marie...
Materials Science in Semiconductor Processing. 171 (2024) - p. 107977 , 2024

Link: https://doi.org/10.1016/..

6

Understanding Interfaces in AlScN/GaN Heterostructures:

Streicher, Isabel ; Leone, Stefano ; Zhang, Meiling...
Advanced Functional Materials. , 2024

Link: https://doi.org/10.1002/..

7

Influence of fluorine implantation on the physical and elec..:

Maurya, Vishwajeet ; Buckley, Julien ; Alquier, Daniel...
Microelectronic Engineering. 274 (2023) - p. 111975 , 2023

Link: https://doi.org/10.1016/..

8

Emerging SiC Applications beyond Power Electronic Devices:

La Via, Francesco ; Alquier, Daniel ; Giannazzo, Filippo...
Micromachines. 14 (2023) 6 - p. 1200 , 2023

Link: https://doi.org/10.3390/..

9

Current transport in Ni Schottky barrier on GaN epilayer gr..:

Greco, Giuseppe ; Fiorenza, Patrick ; Schilirò, Emanuela...
Microelectronic Engineering. 276 (2023) - p. 112009 , 2023

Link: https://doi.org/10.1016/..

10

Development of Low-Resistance Ohmic Contacts with Bilayer N..:

Slimani Tlemcani, Taoufik ; Mauduit, Clément ; Bah, Micka...
ACS Applied Materials & Interfaces. 15 (2023) 6 - p. 8723-8729 , 2023

Link: https://doi.org/10.1021/..

11

Performance improvement with non-alloyed ohmic contacts tec..:

Lesecq, Marie ; Fouzi, Yassine ; Abboud, Ali...
Microelectronic Engineering. 276 (2023) - p. 111998 , 2023

Link: https://doi.org/10.1016/..

12

Electrical Transport Characteristics of Vertical GaN Schott..:

Maurya, Vishwajeet ; Buckley, Julien ; Alquier, Daniel...
Energies. 16 (2023) 14 - p. 5447 , 2023

Link: https://doi.org/10.3390/..

13

Importance of layer distribution in Ni and Au based ohmic c..:

Mauduit, Clément ; Tlemcani, Taoufik Slimani ; Zhang, Meiling...
Microelectronic Engineering. 277 (2023) - p. 112020 , 2023

Link: https://doi.org/10.1016/..

14

Electrical, morphological and structural properties of Ti o..:

Berger, Clément ; Alquier, Daniel ; Bah, Micka.
Materials Science in Semiconductor Processing. 151 (2022) - p. 106983 , 2022

Link: https://doi.org/10.1016/..

15

Optimisation of Ti Ohmic Contacts Formed by Laser Annealing..:

Berger, Clément ; Alquier, Daniel ; Michaud, Jean-François
Materials Science Forum. 1062 (2022) - p. 219-223 , 2022

Link: https://doi.org/10.4028/..