Ambacher, Oliver
348  Ergebnisse:
Personensuche X
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4

Defect Location in Laterally Aligned Tin Oxide Nanowires: T..:

Bürger, Jasmin-Clara ; Gutsch, Sebastian ; Wollersen, Vanessa...
The Journal of Physical Chemistry C.  127 (2023)  22 - p. 10871-10877 , 2023
 
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6

A Scalable Small-Signal and Noise Model for High-Electron-M..:

Heinz, Felix ; Thome, Fabian ; Schwantuschke, Dirk..
IEEE Transactions on Microwave Theory and Techniques.  70 (2022)  2 - p. 1097-1110 , 2022
 
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7

Leakage mechanism in Alx Ga1−x N/GaN heterostructures with ..:

Köhler, Klaus ; Pletschen, Wilfried ; Kirste, Lutz...
Semiconductor Science and Technology.  37 (2022)  2 - p. 025016 , 2022
 
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8

Enhanced AlScN/GaN Heterostructures Grown with a Novel Prec..:

Streicher, Isabel ; Leone, Stefano ; Kirste, Lutz...
physica status solidi (RRL) – Rapid Research Letters.  17 (2022)  2 - p. , 2022
 
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9

A Cryogenic On-Chip Noise Measurement Procedure With ±1.4-K..:

, In: 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022,
Heinz, Felix ; Thome, Fabian ; Leuther, Arnulf. - p. 233-236 , 2022
 
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12

A 50-nm Gate-Length Metamorphic HEMT Technology Optimized f..:

Heinz, Felix ; Thome, Fabian ; Leuther, Arnulf.
IEEE Transactions on Microwave Theory and Techniques.  69 (2021)  8 - p. 3896-3907 , 2021
 
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14

Low-Power Differential Input to Single-Ended Output GaN RF-..:

Weis, Markus ; Friesicke, Christian ; Quay, Rudiger.
IEEE Transactions on Microwave Theory and Techniques.  69 (2021)  3 - p. 1646-1653 , 2021
 
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15

Technology of GaN-Based Large Area CAVETs With Co-Integrate..:

Doring, Philipp ; Driad, Rachid ; Reiner, Richard...
IEEE Transactions on Electron Devices.  68 (2021)  11 - p. 5547-5552 , 2021
 
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