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Amir, Walid
187  Ergebnisse:
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1

Reliability Instability Assessment with Interfacial Trappin..:

Amir, Walid ; Shin, Ju-Won ; Chakraborty, Surajit...
physica status solidi (a).  , 2024
Link: https://doi.org/10.1002/..
 
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2

Effect of Stress Voltage and Temperature on the Reliability..:

Chakraborty, Surajit ; Amir, Walid ; Hoshi, Takuya...
physica status solidi (a).  , 2023
Link: https://doi.org/10.1002/..
 
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3

Performance Enhancement of AlGaN/GaN HEMT via Trap-State Im..:

Amir, Walid ; Shin, Ju-Won ; Shin, Ki-Yong...
IEEE Transactions on Electron Devices.  70 (2023)  6 - p. 2988-2993 , 2023
Link: https://doi.org/10.1109/..
 
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4

New Methodology for Parasitic Resistance Extraction and Cap..:

Chakraborty, Surajit ; Amir, Walid ; Kwon, Hyuk-Min.
Electronics.  12 (2023)  14 - p. 3044 , 2023
Link: https://doi.org/10.3390/..
 
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5

Precise channel temperature prediction in AlGaN/GaN HEMTs v..:

Chakraborty, Surajit ; Shin, Ju-Won ; Amir, Walid...
Solid-State Electronics.  210 (2023)  - p. 108788 , 2023
Link: https://doi.org/10.1016/..
 
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6

Effect of Trap Behavior on the Reliability Instability of M..:

Shin, Ki-Yong ; Shin, Ju-Won ; Amir, Walid...
Materials.  16 (2023)  18 - p. 6138 , 2023
Link: https://doi.org/10.3390/..
 
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7

Impact of Charge-Trapping Effects on Reliability Instabilit..:

Amir, Walid ; Chakraborty, Surajit ; Kwon, Hyuk-Min.
Materials.  16 (2023)  12 - p. 4469 , 2023
Link: https://doi.org/10.3390/..
 
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8

Explicit Thermal Resistance Model of Self-Heating Effects o..:

Chakraborty, Surajit ; Amir, Walid ; Shin, Ju-Won...
Materials.  15 (2022)  23 - p. 8415 , 2022
Link: https://doi.org/10.3390/..
 
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9

Vertical homo-junction In Ga As tunneling field-effect tran..:

Baek, Ji-Min ; Kim, Hyo-Jin ; Yoo, Ji-Hoon...
Solid-State Electronics.  197 (2022)  - p. 108447 , 2022
Link: https://doi.org/10.1016/..
 
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10

Instability Assessment of AlGaN/GaN High Electron Mobility ..:

, In: 2022 Asia-Pacific Microwave Conference (APMC),
Amir, Walid ; Shin, Ju-Won ; Chakraborty, Surajit... - p. 184-186 , 2022
Link: https://doi.org/10.23919..
 
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11

Trap Behavior of Metamorphic HEMTs with Pulsed IV and $1/f$..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),
Shin, Ki-Yong ; Shin, Ju-Won ; Chakraborty, Surajit... - p. 324-327 , 2022
Link: https://doi.org/10.1109/..
 
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12

Author Correction: A quantitative approach for trap analysi..:

Amir, Walid ; Shin, Ju‑Won ; Shin, Ki‑Yong...
Scientific Reports.  11 (2021)  1 - p. , 2021
Link: https://doi.org/10.1038/..
 
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13

A quantitative approach for trap analysis between Al0.25Ga0..:

Amir, Walid ; Shin, Ju-Won ; Shin, Ki-Yong...
Scientific Reports.  11 (2021)  1 - p. , 2021
Link: https://doi.org/10.1038/..
 
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14

Comprehensive Analysis of Quantum Mechanical Effects of Int..:

Amir, Walid ; Kim, Dae-Hyun ; Kim, Tae-Woo
IEEE Access.  8 (2020)  - p. 211464-211473 , 2020
Link: https://doi.org/10.1109/..
 
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15

Effect of Trap Behavior on the Reliability Instability of M..:

Shin, Ki-Yong ; Shin, Ju-Won ; Amir, Walid...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10532433/.  , 2023
Link: http://www.ncbi.nlm.nih...
 
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