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Amishiro, Hiroyuki
9  Ergebnisse:
Personensuche X
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1

Impact of Recovery Characteristics on Switching Loss of SiC..:

Tominaga, Takaaki ; Iwamatsu, Toshiaki ; Nakao, Yukiyasu...
Materials Science Forum.  1062 (2022)  - p. 447-451 , 2022
Link: https://doi.org/10.4028/..
 
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2

Body Potential Control via p-Type Contact Resistance and It..:

Tominaga, Takaaki ; Iwamatsu, Toshiaki ; Nakao, Yukiyasu...
IEEE Transactions on Electron Devices.  69 (2022)  1 - p. 285-290 , 2022
Link: https://doi.org/10.1109/..
 
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3

Influence of recovery characteristics on switching behavior..:

Tominaga, Takaaki ; Iwamatsu, Toshiaki ; Nakao, Yukiyasu...
Japanese Journal of Applied Physics.  59 (2020)  8 - p. 084003 , 2020
Link: https://doi.org/10.35848..
 
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4

Coulomb-limited mobility in 4H-SiC MOS inversion layer as a..:

Noguchi, Munetaka ; Iwamatsu, Toshiaki ; Amishiro, Hiroyuki...
Japanese Journal of Applied Physics.  59 (2020)  5 - p. 051006 , 2020
Link: https://doi.org/10.35848..
 
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5

Carrier transport properties in inversion layer of Si-face ..:

Noguchi, Munetaka ; Iwamatsu, Toshiaki ; Amishiro, Hiroyuki...
Japanese Journal of Applied Physics.  58 (2019)  3 - p. 031004 , 2019
Link: https://doi.org/10.7567/..
 
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6

Hall effect mobility in inversion layer of 4H-SiC MOSFETs w..:

Noguchi, Munetaka ; Iwamatsu, Toshiaki ; Amishiro, Hiroyuki...
Japanese Journal of Applied Physics.  58 (2019)  SB - p. SBBD14 , 2019
Link: https://doi.org/10.7567/..
 
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7

Hall effect mobility for SiC MOSFETs with increasing dose o..:

Noguchi, Munetaka ; Iwamatsu, Toshiaki ; Amishiro, Hiroyuki...
Japanese Journal of Applied Physics.  57 (2018)  4S - p. 04FR13 , 2018
Link: https://doi.org/10.7567/..
 
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8

Accuracy of the Energy Distribution of the Interface States..:

Noguchi, Munetaka ; Iwamatsu, Toshiaki ; Amishiro, Hiroyuki...
Materials Science Forum.  858 (2016)  - p. 437-440 , 2016
Link: https://doi.org/10.4028/..
 
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9

Impact of Well Edge Proximity Effect on Timing:

KANAMOTO, Toshiki ; OGASAHARA, Yasuhiro ; NATSUME, Keiko...
http://journals.fcla.edu/ietfec-a/article/view/17822/17488.  , 2008
Link: http://journals.fcla.edu..
 
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