An, Tae Yong
20682  Ergebnisse:
Personensuche X
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6

A Semiconductor Open Failure Analysis Assisted by Scanning ..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Tae, Yong-Gyoung ; An, Ha-Young ; Jin, Justin.. - p. 1-4 , 2023
 
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7

Highly scalable and reliable 2-bit/cell SONOS memory transi..:

, In: Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005.,
Byung Yong Choi ; Dong Won Kim ; Choong-Ho Lee... - p. 118,119 , 2005
 
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8

Edge representation with fuzzy sets in blurred images:

Tae Yong Kim ; Joon Hee Han
Fuzzy Sets and Systems.  100 (1998)  1-3 - p. 77-87 , 1998
 
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