Andrieu, F.
2371  Ergebnisse:
Personensuche X
?
1

Data Retention Insights from Joint Analysis on BEOL-Integra..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Laguerre, J. ; Martin, S. ; Coignus, J.... - p. 1-7 , 2024
 
?
2

Charge-based Sense Demonstration in 1T-1C HZO FeRAM Arrays ..:

, In: 2024 IEEE International Memory Workshop (IMW),
Billoint, O. ; Martin, S. ; Laguerre, J.... - p. 1-4 , 2024
 
?
3

Reliability assessment of hafnia-based ferroelectric device..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Grenouillet, L. ; Barbot, J. ; Laguerre, J.... - p. 1-8 , 2023
 
?
4

Crossbar Arrays based on "Wall" Phase-Change Memory (PCM) a..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Bourgeois, G. ; Meli, V. ; Antonelli, R.... - p. 1-3 , 2023
 
?
5

Memory Window in Si:HfO2 FeRAM arrays: Performance Improvem..:

, In: 2023 IEEE International Memory Workshop (IMW),
Laguerre, J. ; Bocquet, M. ; Billoint, O.... - p. 1-4 , 2023
 
?
6

Designing networks of resistively-coupled stochastic Magnet..:

, In: 2023 International Electron Devices Meeting (IEDM),
Danouchi, K. ; Soumah, L. ; Bouchard, C.... - p. 1-4 , 2023
 
?
8

Convolution neural network inference using frequency modula..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Trabelsi, A. ; Cagli, C. ; Hirtzlin, T.... - p. 1-4 , 2023
 
?
 
?
11

Fabrication of Low-Power RRAM for Stateful Hyperdimensional..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Dubreuil, T. ; Barraud, S. ; Previtali, B.... - p. 1-2 , 2023
 
?
12

3D sequential integration with Si CMOS stacked on 28nm indu..:

, In: 2023 International Electron Devices Meeting (IEDM),
Mota-Frutuoso, T. ; Lapras, V. ; Brunet, L.... - p. 1-4 , 2023
 
?
13

Investigation of resistance fluctuations in ReRAM: physical..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Reganaz, L. ; Deleruyelle, D. ; Rafhay, Q.... - p. 1-6 , 2023
 
?
14

Integration of HfO2-based 3D OxRAM with GAA stacked-nanoshe..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Dubreuil, T. ; Barraud, S. ; Pedini, J.-M.... - p. 117-120 , 2023
 
?
15

BEOL Integrated Ferroelectric HfO₂-Based Capacitors for FeR..:

Alcala, R. ; Materano, M. ; Lomenzo, P. D....
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 907-912 , 2022
 
1-15
Mehr Literatur finden