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Andrzej Mazurak
21  Ergebnisse:
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1

Characterization of resistive switching phenomena in therma..:

, In: 2023 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK),
Wisniewski, Piotr ; Stonio, Bartlomiej ; Jasinski, Jakub. - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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2

Study of silicon-oxide RRAM devices based on complex impeda..:

Wiśniewski, Piotr ; Mazurak, Andrzej ; Jasiński, Jakub.
Solid-State Electronics.  208 (2023)  - p. 108732 , 2023
Link: https://doi.org/10.1016/..
 
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3

Investigation of the Temperature Effect on Electrical Chara..:

Wiśniewski, Piotr ; Nieborek, Mateusz ; Mazurak, Andrzej.
Micromachines.  13 (2022)  10 - p. 1641 , 2022
Link: https://doi.org/10.3390/..
 
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4

Investigation of the anomalous effect of the AC-signal freq..:

Mazurak, Andrzej ; Majkusiak, Bogdan
Solid-State Electronics.  183 (2021)  - p. 108107 , 2021
Link: https://doi.org/10.1016/..
 
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5

Investigation of Electrical Properties of the Al/SiO2/n++-S..:

Wiśniewski, Piotr ; Jasiński, Jakub ; Mazurak, Andrzej..
Materials.  14 (2021)  20 - p. 6042 , 2021
Link: https://doi.org/10.3390/..
 
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6

Silicon-Carbide (SiC) Nanocrystal Technology and Characteri..:

Mazurak, Andrzej ; Mroczyński, Robert ; Beke, David.
Nanomaterials.  10 (2020)  12 - p. 2387 , 2020
Link: https://doi.org/10.3390/..
 
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7

Memory effect in MIS structures with embedded all-inorganic..:

, In: 2019 IEEE 14th Nanotechnology Materials and Devices Conference (NMDC),
Mazurak, Andrzej ; Mroczynski, Robert - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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8

Comparison of memory effect with voltage or current chargin..:

Mazurak, Andrzej ; Mroczyński, Robert
Solid-State Electronics.  159 (2019)  - p. 157-164 , 2019
Link: https://doi.org/10.1016/..
 
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9

Stress‐and‐Sense Investigation of Memory Effect in Si‐NCs M..:

Mazurak, Andrzej ; Jasiński, Jakub ; Mroczyński, Robert
physica status solidi (b).  255 (2018)  10 - p. , 2018
Link: https://doi.org/10.1002/..
 
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10

Small-signal admittance model of multi-traps distributed ov..:

Jasiński, Jakub ; Mazurak, Andrzej ; Mroczyński, Robert.
Microelectronic Engineering.  147 (2015)  - p. 349-353 , 2015
Link: https://doi.org/10.1016/..
 
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11

Study of the effect of tunneling through the traps inside t..:

Jasiński, Jakub ; Mazurak, Andrzej ; Majkusiak, Bogdan
Microelectronic Engineering.  109 (2013)  - p. 1-4 , 2013
Link: https://doi.org/10.1016/..
 
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12

Investigation of the Temperature Effect on Electrical Chara..:

Piotr Wiśniewski ; Mateusz Nieborek ; Andrzej Mazurak.
E:Engineering and Technology.  , 2022
Link: https://doi.org/10.3390/..
 
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13

Investigation of the Temperature Effect on Electrical Chara..:

Piotr Wiśniewski ; Mateusz Nieborek ; Andrzej Mazurak.
https://www.mdpi.com/2072-666X/13/10/1641.  , 2022
Link: https://doi.org/10.3390/..
 
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14

Investigation of Electrical Properties of the Al/SiO 2 /n +..:

Piotr Wiśniewski ; Jakub Jasiński ; Andrzej Mazurak..
https://www.mdpi.com/1996-1944/14/20/6042.  , 2021
Link: https://doi.org/10.3390/..
 
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15

Investigation of Electrical Properties of the Al/SiO2/n++-S..:

Piotr Wiśniewski ; Jakub Jasiński ; Andrzej Mazurak..
Electronic Materials.  , 2021
Link: https://doi.org/10.3390/..
 
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