Anjum, Taseer
24  Ergebnisse:
Personensuche X
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5

X-ray diffraction reveals the amount of strain and homogene..:

Davtyan, Arman ; Kriegner, Dominik ; Holý, Václav...
Journal of Applied Crystallography.  53 (2020)  5 - p. 1310-1320 , 2020
 
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6

Beam damage of single semiconductor nanowires during X-ray ..:

Al Hassan, Ali ; Lähnemann, Jonas ; Davtyan, Arman...
Journal of Synchrotron Radiation.  27 (2020)  5 - p. 1200-1208 , 2020
 
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8

Impact of Electrical Current on Single GaAs Nanowire Struct..:

Bahrami, Danial ; AlHassan, Ali ; Davtyan, Arman...
info:eu-repo/semantics/altIdentifier/doi/10.1002/pssb.202100056.  , 2021
 
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11

Nanomechanics: Mechanical response analysis of semiconducto..:

Anjum, Taseer
https://dspace.ub.uni-siegen.de/handle/ubsi/1893.  , 2021
 
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12

Nanomechanics: Mechanical response analysis of semiconducto..:

Anjum, Taseer
vignette : https://noah.nrw/titlepage/urn/urn:nbn:de:hbz:467-18932/128.  , 2021
 
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15

X-ray diffraction reveals the amount of strain and homogene..:

Davtyan, Arman ; Kriegner, Dominik ; Holy, Vaclav...
info:eu-repo/semantics/altIdentifier/doi/10.1107/S1600576720011516.  , 2020
 
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