Arnaud, F
10667  Ergebnisse:
Personensuche X
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3

3D sequential integration with Si CMOS stacked on 28nm indu..:

, In: 2023 International Electron Devices Meeting (IEDM),
Mota-Frutuoso, T. ; Lapras, V. ; Brunet, L.... - p. 1-4 , 2023
 
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6

Heater system optimization for robust ePCM reliability and ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ranica, R. ; Berthelon, R. ; Gandolfo, A.... - p. 28.1.1-28.1.4 , 2021
 
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7

Crystallization behavior of N -doped Ge-rich GST thin films..:

Thomas, O. ; Mocuta, C. ; Putero, M....
Microelectronic Engineering.  244-246 (2021)  - p. 111573 , 2021
 
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10

Tracing Natural Organic Matter at the Scale of Drainage Bas..:

, In: Electron Paramagnetic Resonance Spectroscopy,
Pépin-Donat, B. ; Poulenard, J. ; Blondel, T.... - p. 29-50 , 2020
 
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12

Palaeomagnetism for chronologies of recent alpine lake sedi..:

Crouzet, C. ; Wilhelm, B. ; Sabatier, P....
Journal of Paleolimnology.  62 (2019)  3 - p. 259-278 , 2019
 
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13

Crystallization Speed in Ge-Rich PCM Cells as a Function of..:

Gomiero, E. ; Ristoiu, D. ; Reynard, J. P....
IEEE Journal of the Electron Devices Society.  7 (2019)  - p. 517-521 , 2019
 
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14

Coupling indicators and lumped-parameter modeling to assess..:

Trévisan, D. ; Giguet-Covex, C. ; Sabatier, P...
Science of The Total Environment.  650 (2019)  - p. 3027-3040 , 2019
 
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15

28nm FDSOI Platform with Embedded PCM for IoT, ULP, Digital..:

, In: ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC),
ARNAUD, F. ; HAENDLER, S. ; CLERC, S.... - p. 7-10 , 2019
 
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