Artem Glukhov
22  Ergebnisse:
Personensuche X
?
1

Process-Voltage-Temperature Variations Assessment in Energy..:

Rizzi, Tommaso ; Baroni, Andrea ; Glukhov, Artem...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  3 - p. 328-336 , 2023
 
?
2

End-to-end modeling of variability-aware neural networks ba..:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
Glukhov, Artem ; Lepri, Nicola ; Milo, Valerio... - p. 1-5 , 2022
 
?
3

Mitigating read-program variation and IR drop by circuit ar..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Lepri, Nicola ; Glukhov, Artem ; Ielmini, Daniele - p. 3C.2-1-3C.2-6 , 2022
 
?
4

Exploring Process-Voltage-Temperature Variations Impact on ..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
 
?
5

Low Conductance State Drift Characterization and Mitigation..:

Baroni, Andrea ; Glukhov, Artem ; Perez, Eduardo...
IEEE Transactions on Device and Materials Reliability.  22 (2022)  3 - p. 340-347 , 2022
 
?
7

An energy-efficient in-memory computing architecture for su..:

Andrea Baroni ; Artem Glukhov ; Eduardo Pérez...
https://www.frontiersin.org/articles/10.3389/fnins.2022.932270/full.  , 2022
 
?
 
?
13

Accurate Program/Verify Schemes of Resistive Switching Memo..:

Milo, Valerio ; Glukhov, Artem ; Perez, Eduardo...
info:eu-repo/semantics/altIdentifier/wos/WOS:000678349800021.  , 2021
 
1-15