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Asanovski, R.
7  Ergebnisse:
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1

Characterization and Advanced Modeling of Dielectric Defect..:

Asanovski, R. ; Arimura, H. ; de Marneffe, J.-F....
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1745-1751 , 2024
Link: https://doi.org/10.1109/..
 
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2

Characterization of DC performance and low-frequency noise ..:

Asanovski, R. ; Grill, A. ; Franco, J....
Solid-State Electronics.  215 (2024)  - p. 108881 , 2024
Link: https://doi.org/10.1016/..
 
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3

Probing Band Tail States in MOSFETs at Cryogenic Temperatur..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
Asanovski, R. ; Grill, A. ; Franco, J.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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4

New insights on the excess 1/f noise at cryogenic temperatu..:

, In: 2022 International Electron Devices Meeting (IEDM),
Asanovski, R. ; Grill, A. ; Franco, J.... - p. 30.5.1-30.5.4 , 2022
Link: https://doi.org/10.1109/..
 
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5

Characterization and Advanced Modeling of Dielectric Defect..:

Asanovski, R ; Arimura, H ; de Marneffe, J. -F...
firstpage:1.  , 2024
Link: https://hdl.handle.net/1..
 
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6

Understanding the Excess 1/f Noise in MOSFETs at Cryogenic ..:

Asanovski R ; Grill A ; Franco J...
info:eu-repo/semantics/altIdentifier/wos/WOS:000915823900001.  , 2023
Link: https://hdl.handle.net/1..
 
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7

Understanding the Excess 1/f Noise in MOSFETs at Cryogenic ..:

Asanovski, R ; Grill, A ; Franco, J...
info:eu-repo/semantics/altIdentifier/wos/WOS:000915823900001.  , 2023
Link: https://hdl.handle.net/1..
 
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