Augendre, E.
67  Ergebnisse:
Personensuche X
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1

RF figures of merit of polysilicon trap-rich layers formed ..:

, In: 2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems,
Perrose, M. ; Alba, P. Acosta ; Moulin, M.... - p. 25-27 , 2023
 
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2

Imaging, Modeling and Engineering of Strain in Gate-All-Aro..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Reboh, S. ; Boureau, V. ; Yamashita, T.... - p. 11.5.1-11.5.4 , 2019
 
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4

Converting SOI to sSOI through Amorphization and Crystalliz..:

Maitrejean, S. ; Loubet, N. ; Augendre, E....
ECS Journal of Solid State Science and Technology.  4 (2015)  9 - p. P376-P381 , 2015
 
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8

Hybrid integration for silicon photonics applications:

Grenouillet, L. ; Dupont, T. ; Philippe, P....
Optical and Quantum Electronics.  44 (2012)  12-13 - p. 527-534 , 2012
 
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14

A comparative 1/f noise study of GeOI wafers obtained by th..:

Valenza, M. ; El Husseini, J. ; Gyani, J....
Microelectronic Engineering.  88 (2011)  7 - p. 1298-1300 , 2011
 
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