Béchou, L.
106  Ergebnisse:
Personensuche X
?
1

Life test result on 4 channel VCELs chip used in 28Gb/s dat..:

Joly, S. ; Ouattara, M. ; Guibault, G....
Microelectronics Reliability.  150 (2023)  - p. 115120 , 2023
 
?
2

Influence of Losses, Device Size, and Mode Confinement on I..:

Girault, P. ; Oyhenart, L. ; Rouanet, T....
Journal of Lightwave Technology.  41 (2023)  5 - p. 1571-1581 , 2023
 
?
3

Highlighting two integration technologies based on vias: Th..:

Balmont, M. ; Bord Majek, I. ; Poupard, B...
Microelectronics Reliability.  88-90 (2018)  - p. 1108-1112 , 2018
 
?
4

A quantitative thermal and thermomechanical analysis for de..:

Joly, S. ; Lemesre, M-A. ; Levrier, B....
Optics & Laser Technology.  105 (2018)  - p. 229-241 , 2018
 
?
6

Practical optical gain by an extended Hakki-Paoli method:

Vanzi, M. ; Marcello, G. ; Mura, G....
Microelectronics Reliability.  76-77 (2017)  - p. 579-583 , 2017
 
?
7

Investigations on electro-optical and thermal performances ..:

Michaud, J. ; Pedroza, G. ; Béchou, L....
Microelectronics Reliability.  55 (2015)  9-10 - p. 1746-1749 , 2015
 
?
8

Correlation between forward-reverse low-frequency noise and..:

Del Vecchio, P. ; Curutchet, A. ; Deshayes, Y....
Microelectronics Reliability.  55 (2015)  9-10 - p. 1741-1745 , 2015
 
?
10

Study of a polymer optical microring resonator for hexavale..:

Meziane, F. ; Raimbault, V. ; Hallil, H....
Sensors and Actuators B: Chemical.  209 (2015)  - p. 1049-1056 , 2015
 
?
11

Durability study of a fluorescent optical memory in glass s..:

Royon, A. ; Bourhis, K. ; Béchou, L....
Microelectronics Reliability.  53 (2013)  9-11 - p. 1514-1518 , 2013
 
?
12

Saint-Venant's principle and the minimum length of a dual-c..:

Suhir, E. ; Bechou, L.
Microelectronics Reliability.  53 (2013)  9-11 - p. 1506-1509 , 2013
 
?
15

An original DoE-based tool for silicon photodetectors EoL e..:

Spezzigu, P. ; Bechou, L. ; Quadri, G....
Microelectronics Reliability.  51 (2011)  9-11 - p. 1999-2003 , 2011
 
1-15