BISSCHOP, A
1279  Ergebnisse:
Personensuche X
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6

Optical method for measuring slow crack growth in cementiti..:

Cai, W. ; Bisschop, J.
Materials and Structures.  45 (2012)  11 - p. 1613-1623 , 2012
 
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7

Changes in Biomechanical, Histological and Quantitative MRI..:

Paul, C. P. ; Strijkers, G. J. ; de Graaf, M....
Global Spine Journal.  2 (2012)  1_suppl - p. s-0032-1319960-s-0032-1319960 , 2012
 
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8

Determination of the stress level for voltage screen of int..:

Kho, R.M. ; Moonen, A.J. ; Girault, V.M....
Microelectronics Reliability.  50 (2010)  9-11 - p. 1210-1214 , 2010
 
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9

Reliability methods and standards:

Bisschop, J.
Microelectronics Reliability.  47 (2007)  9-11 - p. 1330-1335 , 2007
 
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10

In situ AFM study of the dissolution and recrystallization ..:

Bisschop, J. ; Dysthe, D.K. ; Putnis, C.V..
Geochimica et Cosmochimica Acta.  70 (2006)  7 - p. 1728-1738 , 2006
 
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11

Brittle deformation of quartz in a diamond anvil cell:

Bisschop, J. ; den Brok, B. ; Miletich, R.
Journal of Structural Geology.  27 (2005)  6 - p. 943-947 , 2005
 
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14

Temporal and spatial development of drying shrinkage cracki..:

Shiotani, T ; Bisschop, J ; Van Mier, J.G.M
Engineering Fracture Mechanics.  70 (2003)  12 - p. 1509-1525 , 2003
 
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15

Fast temperature cycling and electromigration induced thin ..:

Nguyen, H.V. ; Salm, C. ; Vroemen, J....
Microelectronics Reliability.  42 (2002)  9-11 - p. 1415-1420 , 2002
 
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