Bach, Thomas
~ 3200  Ergebnisse:
Personensuche X
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1

Taming Timeout Flakiness: An Empirical Study of SAP HANA:

, In: 2024 IEEE/ACM 46th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP),
 
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2

Taming Timeout Flakiness: An Empirical Study of SAP HANA:

, In: Proceedings of the 46th International Conference on Software Engineering: Software Engineering in Practice,
 
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4

The Vocabulary of Flaky Tests in the Context of SAP HANA:

, In: 2023 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM),
 
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5

A Multidimensional Analysis of Bug Density in SAP HANA:

, In: Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering,
Reck, Julian ; Bach, Thomas ; Stoess, Jan - p. 1997-2007 , 2023
 
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9

Automatic Error Classification and Root Cause Determination..:

, In: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST),
 
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11

Determining Method-Call Sequences for Object Creation in C+:

, In: 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST),
 
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