Badel, N.
101  Ergebnisse:
Personensuche X
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1

Validation of a model of the Symbia Intevo Bold SPECT scann..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Bui, M.H.H. ; Robert, A. ; Badel, J.N.... - p. 1-1 , 2023
 
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8

Advanced silicon thin films for high-efficiency silicon het..:

, In: 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC),
Descoeudres, A. ; Allebe, C. ; Badel, N.... - p. 1-5 , 2017
 
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