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Bagga, Navjeet
60  Ergebnisse:
Personensuche X
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1

Assessment of the Biosensing Capabilities of SiGe Heterojun..:

Singh, Shailendra ; Agnihotri, Suneet Kumar ; Bagga, Navjeet.
ACS Applied Bio Materials.  7 (2024)  2 - p. 812-826 , 2024
Link: https://doi.org/10.1021/..
 
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2

Unveiling the Role of Interface and Dielectric Wall Traps w..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Rathore, Sunil ; Kumar, Sandeep ; Shakir, Mohd... - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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3

Small-signal non-quasi-static model of a multi-fin FinFET f..:

Patel, Jyoti ; Aggarwal, Nitya ; Bagga, Navjeet..
Journal of Computational Electronics.  23 (2024)  2 - p. 233-243 , 2024
Link: https://doi.org/10.1007/..
 
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4

Sensitivity and Reliability Assessment of a Strained Silico..:

, In: 2024 IEEE Latin American Electron Devices Conference (LAEDC),
Gandhi, Navneet ; Rathore, Sunil ; Jaisawal, Rajeewa Kumar... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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5

Self-Heating and Process-Induced Threshold Voltage Aware Re..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Rathore, Sunil ; Bagga, Navjeet ; Dasgupta, S. - p. P65.TX-1-P65.TX-4 , 2024
Link: https://doi.org/10.1109/..
 
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6

Steep-Subthreshold Bilayer Tunnel Field-Effect Transistor-B..:

Kumar, Prateek ; Kumar, Naveen ; Dixit, Ankit...
IEEE Sensors Letters.  8 (2024)  8 - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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7

Biomolecule detection using GaAs1−xSbX FET based dielectric..:

Dixit, Ankit ; Samajdar, Dip Prakash ; Shukla, Rajendra P..
Physica Scripta.  99 (2024)  2 - p. 025020 , 2024
Link: https://doi.org/10.1088/..
 
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8

Unveiling the reliability of negative capacitance FinFET wi..:

Kumar Jaisawal, Rajeewa ; Rathore, Sunil ; Kondekar, P.N..
Solid-State Electronics.  215 (2024)  - p. 108896 , 2024
Link: https://doi.org/10.1016/..
 
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9

Low-Voltage Feedback-Field-Effect-Transistor-Based Ion Sens..:

Kumar, Prateek ; Kumar, Naveen ; Dixit, Ankit...
IEEE Sensors Letters.  8 (2024)  6 - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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10

A proof of concept for reliability aware analysis of juncti..:

Gandhi, Navneet ; Jaisawal, Rajeewa Kumar ; Rathore, Sunil..
Smart Materials and Structures.  33 (2024)  3 - p. 035010 , 2024
Link: https://doi.org/10.1088/..
 
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11

Self-Heating and Interface Traps Assisted Early Aging Revel..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Jaisawal, Rajeewa Kumar ; Rathore, Sunil ; Gandhi, Navneet... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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12

Analytical Model of Dual Cavity Nanowire Tunnel FET-based D..:

, In: 2023 IEEE Devices for Integrated Circuit (DevIC),
Sarkhel, Saheli ; Rathore, Sunil ; Saha, Priyanka... - p. 470-475 , 2023
Link: https://doi.org/10.1109/..
 
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13

Analog/RF and Linearity Performance Assessment of a Negativ..:

Jaisawal, Rajeewa Kumar ; Rathore, Sunil ; Kondekar, P. N..
IEEE Transactions on Nanotechnology.  22 (2023)  - p. 545-551 , 2023
Link: https://doi.org/10.1109/..
 
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14

Performance Investigation of Source/Drain Extension Region ..:

, In: 2023 Silicon Nanoelectronics Workshop (SNW),
Srivastava, Shobhit ; Panwar, Sourabh ; M., Shashidhara... - p. 79-80 , 2023
Link: https://doi.org/10.23919..
 
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15

Demonstration of a Nanosheet FET With High Thermal Conducti..:

Rathore, Sunil ; Jaisawal, Rajeewa Kumar ; Kondekar, P. N..
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 1970-1976 , 2023
Link: https://doi.org/10.1109/..
 
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