E-LIB Suche - Ergebnisse für: Balen, Tiago Roberto - Sprache DE

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1

Fault Detection, Diagnosis and Prediction in Electrical Val..:

Gonçalves, Luiz Fernando ; Bosa, Jefferson Luiz ; Balen, Tiago Roberto...
Journal of Electronic Testing. 27 (2011) 4 - p. 551-564 , 2011

Link: https://doi.org/10.1007/..

2

Evaluating the effectiveness of a mixed-signal TMR scheme b..:

, In: Proceedings of the 23rd symposium on Integrated circuits and system design,

Borges, Gabriel de Morais ; Gonçalves, Luiz Fernando ; Balen, Tiago Roberto. - p. 134-139 , 2010

Link: https://dl.acm.org/doi/1..

3

Evaluation of single event upset susceptibility of FinFET-b..:

Copetti, Thiago Santos ; Medeiros, Guilherme Cardoso ; Taouil, Mottaqiallah...
Journal of electronic testing : theory and applications. Dordrecht : Kluwer. Vol. 37 (2021), p. 383-394. , 2021

Link: http://hdl.handle.net/10..

4

Testing a fault tolerant mixed-signal design under TID and ..:

González Aguilera, Carlos Julio ; Machado, Diego do Nascimento ; Vaz, Rafael Galhardo...
Journal of integrated circuits and systems. Porto Alegre. Vol. 16, no.3 (2021), p. 1-10. , 2021

Link: http://hdl.handle.net/10..

5

Comparing the impact of power supply voltage on CMOS-and Fi..:

Copetti, Thiago Santos ; Balen, Tiago Roberto ; Brum, Eduardo Longo de..
Journal of electronic testing : theory and applications. Dordrecht : Kluwer. Vol. 36 (2020), p. 271-284. , 2020

Link: http://hdl.handle.net/10..

6

Design of an integrated system for on-line test and diagnos..:

Piccoli, Leonardo Bisch ; Henriques, Renato Ventura Bayan ; Balen, Tiago Roberto
Journal of electronic testing : theory and applications. Dordrecht : Kluwer. Vol. 36 (2020), p. 547-553. , 2020

Link: http://hdl.handle.net/10..

7

Fault injection on a mixed-signal programmable SoC with des..:

González Aguilera, Carlos Julio ; Chenet, Cristiano Pegoraro ; Balen, Tiago Roberto
Journal of integrated circuits and systems. Porto Alegre, RS. Vol. 11, no. 3 (Dec. 2016), p. 185-191. , 2016

Link: http://hdl.handle.net/10..

8

Reliability analysis of 0.5µm CMOS operational amplifiers u..:

Cardoso, Guilherme Schwanke ; Balen, Tiago Roberto ; Lubaszewski, Marcelo Soares.
Journal of integrated circuits and systems. Vol. 9, n. 1(2014), p. 70-79. , 2014

Link: http://hdl.handle.net/10..

9

Efeitos da radiação em dispositivos analógicos programáveis..:

Balen, Tiago Roberto , 2010

Link: http://hdl.handle.net/10..

10

Efeitos da radiação em dispositivos analógicos programáveis..:

Balen, Tiago Roberto , 2010

Link: http://hdl.handle.net/10..

11

A self-checking scheme to mitigate single event upset effec..:

Balen, Tiago Roberto ; Leite, Franco Ripoll ; Kastensmidt, Fernanda Gusmão de Lima.
IEEE transactions on nuclear science. New York. Vol. 56, no. 4, part 2 (Aug. 2009), p. 1950-1957. , 2009

Link: http://hdl.handle.net/10..

12

A self-checking scheme to mitigate single event upset effec..:

Balen, Tiago Roberto ; Leite, Franco Ripoll ; Kastensmidt, Fernanda Gusmão de Lima.
IEEE transactions on nuclear science. New York. Vol. 56, no. 4, part 2 (Aug. 2009), p. 1950-1957. , 2009

Link: http://hdl.handle.net/10..

13

Teste de dispositivos analógicos programáveis (FPAAS):

Balen, Tiago Roberto , 2006

Link: http://hdl.handle.net/10..

14

Teste de dispositivos analógicos programáveis (FPAAS):

Balen, Tiago Roberto , 2006

Link: http://hdl.handle.net/10..

15

Behavioral and Variability Analysis of Enclosed Layout Tran..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),

Platcheck, Gustavo. P. ; Cardoso, G. S. ; Balen, Tiago R. - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

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