Ball, D. R.
13211  Ergebnisse:
Personensuche X
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1

Transsexualism and Transvestitism (II):

Ball, J. R. R.
Australian & New Zealand Journal of Psychiatry.  2 (1968)  1 - p. 24-32 , 1968
 
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2

Single-Event Burnout in Vertical β-Ga₂O₃ Diodes With Pt/PtO..:

Islam, S. ; Senarath, A. S. ; Farzana, E....
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 515-521 , 2024
 
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5

Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Nod:

Pieper, Nicholas J. ; Xiong, Yoni ; Feeley, Alexandra...
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 401-409 , 2023
 
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6

Single-Event Upsets for Single-Port and Two-Port SRAM Cells..:

Pieper, N. J. ; Xiong, Y. ; Pasternak, J....
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1673-1679 , 2023
 
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7

Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxid..:

Cadena, R. M. ; Ball, D. R. ; Zhang, E. X....
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 363-369 , 2023
 
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8

Effects of Collected Charge and Drain Area on SE Response o..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Pieper, N.J. ; Xiong, Y. ; Ball, D.R... - p. 1-6 , 2023
 
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12

HEXITEC 2 × 2 tiled hard X-ray spectroscopic imaging detect..:

Jowitt, L. ; Wilson, M. ; Seller, P....
Journal of Instrumentation.  17 (2022)  1 - p. P01012 , 2022
 
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13

SE Performance of D-FF Designs With Different VT Options at..:

Feeley, A. ; Xiong, Y. ; Pieper, N. J...
IEEE Transactions on Nuclear Science.  69 (2022)  7 - p. 1582-1586 , 2022
 
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14

Single-Event Latchup Vulnerability at the 7-nm FinFET Node:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Pieper, N. J. ; Xiong, Y. ; Feeley, A... - p. 5C.2-1-5C.2-6 , 2022
 
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15

Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Sh..:

Watkins, A. C. ; Vibbert, S. T. ; D'Amico, J. V....
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 374-380 , 2022
 
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