Bar, E.
3366  Ergebnisse:
Personensuche X
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1

MO-0795 Systematic progression changes can assist robust IM..:

Zhang, Y. ; Alshaikhi, J. ; Amos, R.A....
Radiotherapy and Oncology.  170 (2022)  - p. S714-S715 , 2022
 
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3

A statistical approach to the experimental of the leaching ..:

Bar, D. E. ; Barkat, D.
Journal of Mining Science.  52 (2016)  3 - p. 569-575 , 2016
 
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6

Transport properties of ultra-thin granular YBa 2 Cu 3 O 7−..:

Bar, E. ; Levi, D. ; Koren, G...
Physica C: Superconductivity and its Applications.  506 (2014)  - p. 160-164 , 2014
 
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8

Comparison of different methods for simulating the effect o..:

Kunder, D. ; Bär, E.
Microelectronic Engineering.  85 (2008)  5-6 - p. 992-995 , 2008
 
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10

Three-dimensional simulation of ionized metal plasma vapor ..:

Kistler, S. ; Bär, E. ; Lorenz, J..
Microelectronic Engineering.  76 (2004)  1-4 - p. 100-105 , 2004
 
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11

Modeling of chemical–mechanical polishing on patterned wafe..:

Nguyen, P.-H. ; Bär, E. ; Lorenz, J..
Microelectronic Engineering.  76 (2004)  1-4 - p. 89-94 , 2004
 
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12

Simulation of the influence of via sidewall tapering on ste..:

Bär, E. ; Lorenz, J. ; Ryssel, H.
Microelectronic Engineering.  64 (2002)  1-4 - p. 321-328 , 2002
 
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13

Three-dimensional simulation of the conformality of copper ..:

Bär, E ; Lorenz, J ; Ryssel, H
Microelectronic Engineering.  50 (2000)  1-4 - p. 481-486 , 2000
 
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14

Erythritol: an interpretive summary of biochemical, metabol..:

Munro, I.C ; Bernt, W.O ; Borzelleca, J.F...
Food and Chemical Toxicology.  36 (1998)  12 - p. 1139-1174 , 1998
 
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15

Experimental verification of three-dimensional simulations ..:

Bär, E ; Lorenz, J ; Ryssel, H
Microelectronics Reliability.  38 (1998)  2 - p. 287-291 , 1998
 
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