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Barraud, Sylvain
253  Ergebnisse:
Personensuche X
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1

Comprehensive evaluation of gate-induced drain leakage in S..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics.  214 (2024)  - p. 108865 , 2024
Link: https://doi.org/10.1016/..
 
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2

Multimodule microwave assembly for fast readout and charge-..:

von Horstig, Felix-Ekkehard ; Ibberson, David J. ; Oakes, Giovanni A....
Physical Review Applied.  21 (2024)  4 - p. , 2024
Link: https://doi.org/10.1103/..
 
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3

Aptasensors based on silicon nanowire field-effect transist..:

Midahuen, Rony ; Stambouli, Valérie ; Fontelaye, Caroline...
Microelectronic Engineering.  286 (2024)  - p. 112130 , 2024
Link: https://doi.org/10.1016/..
 
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4

Evaluation and implementation of High-Dimensionnal Computin..:

, In: 2024 International Conference on Control, Automation and Diagnosis (ICCAD),
Salerno, Ancelin ; Barraud, Sylvain - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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5

Comprehensive Evaluation of Junctionless and Inversion-Mode..:

Prates, Rhaycen R. ; Barraud, Sylvain ; Cassé, Mikael...
IEEE Journal of the Electron Devices Society.  , 2024
Link: https://doi.org/10.1109/..
 
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6

Influence of interface traps position along channel in the ..:

Doria, Rodrigo T. ; Picoli Junior, Marcos P. ; Barraud, Sylvain.
Solid-State Electronics.  212 (2024)  - p. 108835 , 2024
Link: https://doi.org/10.1016/..
 
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7

Disruptive approaches towards Energy Efficient VLSI Technol..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Faynot, Olivier ; Barraud, Sylvain ; Dubreuil, Theophile... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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8

Extraction of Drain Current Variability Components in Junct..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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9

Drain Current Variability in 2-levels Stacked Nanowire Gate..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Kim, Donghyun ; Barraud, Sylvain ; Ghibaudo, Gerard.. - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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10

Low-field Mobility Degradation Factors Temperature Dependen..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Rodrigues, Jaime Calcade ; Casse, Mikael ; Barraud, Sylvain... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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11

High Temperature and Width Influence on the GIDL of Nanowir..:

De Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
IEEE Journal of the Electron Devices Society.  11 (2023)  - p. 672-680 , 2023
Link: https://doi.org/10.1109/..
 
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12

Experimental assessment of gate-induced drain leakage in SO..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics.  208 (2023)  - p. 108716 , 2023
Link: https://doi.org/10.1016/..
 
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13

Impact of series resistance on the drain current variabilit..:

da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Cassé, Mikaël...
Solid-State Electronics.  208 (2023)  - p. 108737 , 2023
Link: https://doi.org/10.1016/..
 
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14

pH Quantification in Human Dermal Interstitial Fluid Using ..:

Sprunger, Yann ; Capua, Luca ; Ernst, Thomas...
Biosensors.  13 (2023)  10 - p. 908 , 2023
Link: https://doi.org/10.3390/..
 
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15

Electrical Characterization of Ω-Gate Nanowire MOSFETs Down..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Matos, Jefferson Almeida ; de Souza, Michelly ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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