Basa, Peter
42  Ergebnisse:
Personensuche X
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4

M-FOUP SYSTEM performance in a semiconductor process contro:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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15

Internal wettability investigation of mesoporous silica mat..:

Furedi, Mate ; Fodor, Balint ; Marton, Andras...
https://discovery.ucl.ac.uk/id/eprint/10165966/1/InternalContactAngle_manuscript_final2.pdf.  , 2023
 
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