Baschirotto, A.
806  Ergebnisse:
Personensuche X
?
1

$\mathrm{I}_{\text{GS}}-\mathrm{I}_{\text{GD}}$ Gate Curren..:

, In: 2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME),
Torri, F. ; Leman, O. ; Malcovati, P.. - p. 1-4 , 2024
 
?
3

A 4-channel front-end electronics for muon drift tubes dete..:

Shah, S.A.A. ; De Matteis, M. ; Fras, M....
Journal of Instrumentation.  17 (2022)  7 - p. C07012 , 2022
 
?
4

Active Dual Level Gate Driver for Dead Time and Switching L..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Mandelli, E. ; Mariconti, A. ; Ruzza, S.. - p. 258-261 , 2020
 
?
5

A 16 nm-FinFET 100 MHz 4th-order Fully-Differential Super-S..:

, In: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Fary, F. ; De Matteis, M. ; Rota, L... - p. 150-153 , 2019
 
?
6

The new octal amplifier–shaper–discriminator chip for the A..:

Abovyan, S. ; Danielyan, V. ; Fras, M....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  936 (2019)  - p. 374-375 , 2019
 
?
7

1-GRad-TID Effects in 28-nm Device Study for Rad-Hard Analo..:

, In: Next-Generation ADCs, High-Performance Power Management, and Technology Considerations for Advanced Integrated Circuits,
De Matteis, Marcello ; Resta, F. ; Pipino, A.... - p. 299-315 , 2019
 
?
8

sMDT Detectors Read-Out in 28nm technology:

, In: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Pipino, A. ; Resta, F. ; Mangiagalli, L.... - p. 691-694 , 2019
 
?
9

Active Dual Level Gate Driver for Switching Losses Reductio..:

, In: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Mandelli, E. ; Mariconti, A. ; Ruzza, S.. - p. 334-337 , 2019
 
?
10

A 10 MSample/Sec Digital Neural Spike Detection for a 1024 ..:

, In: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Tambaro, M. ; Vallicelli, E. A. ; Tomasella, D... - p. 711-714 , 2019
 
?
11

Effects of the thermodynamic conditions on the acoustic sig..:

Ardid, M. ; Baschirotto, A. ; Burgio, N....
The European Physical Journal C.  79 (2019)  11 - p. , 2019
 
?
12

28 nm Integrated Circuit for PIXel detector:

Resta, F. ; Pipino, A. ; De Matteis, M..
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  904 (2018)  - p. 140-148 , 2018
 
1-15