Basset, L.
6539  Ergebnisse:
Personensuche X
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2

Modulation Of HCI in I/O analog devices Through Process Spe..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Diouf, C. ; Federspiel, X. ; Bravaix, A.... - p. 1-8 , 2023
 
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3

Efficient Interpolation of Rough Line Drawings:

Chen, J. ; Zhu, X. ; Even, M....
Computer Graphics Forum.  42 (2023)  7 - p. , 2023
 
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4

3D sequential integration with Si CMOS stacked on 28nm indu..:

, In: 2023 International Electron Devices Meeting (IEDM),
Mota-Frutuoso, T. ; Lapras, V. ; Brunet, L.... - p. 1-4 , 2023
 
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5

Insight Into HCI Reliability on I/O Nitrided Devices:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Doyen, C. ; Yon, V. ; Garros, X.... - p. 1-5 , 2023
 
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11

Une "Sepsis Team" est elle indispensable dans chaque hopita..:

Rezig, S. ; Branthome, S. ; Basset, A....
Médecine et Maladies Infectieuses.  49 (2019)  4 - p. S55-S56 , 2019
 
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13

Investigation of energy dependance for EBT3 response to irr..:

Basset, A. ; Koumeir, C. ; Chiavassa, S....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  454 (2019)  - p. 56-60 , 2019
 
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