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Bastos, R. Possamai
107  Ergebnisse:
Personensuche X
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1

Assessing the Impacts of Radiation-induced Soft Errors on A..:

Benevenuti, F. ; Gobatto, L. ; Bastos, R. Possamai..
IEEE Transactions on Nuclear Science.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Impact of Scaling up the Sensor Sampling Frequency on the R..:

de Carvalho, M. Minelli ; Laurini, L. H. ; Atukpor, E...
IEEE Sensors Letters.  , 2024
Link: https://doi.org/10.1109/..
 
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3

Bare-Metal Redundant Multi-Threading on Multicore SoCs Unde..:

Serrano-Cases, A. ; Martínez-Álvarez, A. ; Bastos, R. Possamai.
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1643-1651 , 2023
Link: https://doi.org/10.1109/..
 
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4

The Living With a Star Space Environment Testbed Payload:

Dyer, C. S. ; Ryden, K. A. ; Morris, P. A....
IEEE Transactions on Nuclear Science.  70 (2023)  3 - p. 200-215 , 2023
Link: https://doi.org/10.1109/..
 
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5

Redundant Portable Multi-Threading for Soft Error Mitigatio..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Serrano-Cases, A. ; Martinez-Alvarez, A. ; Bastos, R. Possamai. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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6

Effects of thermal neutron radiation on a hardware-implemen..:

Garay Trindade, M. ; Benevenuti, F. ; Letiche, M....
Microelectronics Reliability.  116 (2021)  - p. 114022 , 2021
Link: https://doi.org/10.1016/..
 
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7

Assessment of Machine Learning Algorithms for Near-Sensor C..:

, In: 2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Trindade, M. Garay ; Bastos, R. Possamai ; Garibotti, R.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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8

A Distributed Body-Biasing Strategy for Asynchronous Circui..:

, In: 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC),
Fesquet, L. ; Decoudu, Y. ; Jadue, A. R. Iga... - p. 27-32 , 2019
Link: https://doi.org/10.1109/..
 
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9

Assessing body built-in current sensors for detection of mu..:

Viera, R.A.C. ; Dutertre, J.-M. ; Flottes, M.-L....
Microelectronics Reliability.  88-90 (2018)  - p. 128-134 , 2018
Link: https://doi.org/10.1016/..
 
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10

Method for evaluation of transient-fault detection techniqu..:

Camponogara Viera, R.A. ; Bastos, R. Possamai ; Dutertre, J.-M...
Microelectronics Reliability.  76-77 (2017)  - p. 68-74 , 2017
Link: https://doi.org/10.1016/..
 
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11

Improving the ability of Bulk Built-In Current Sensors to d..:

Dutertre, J.M. ; Possamai Bastos, R. ; Potin, O....
Microelectronics Reliability.  54 (2014)  9-10 - p. 2289-2294 , 2014
Link: https://doi.org/10.1016/..
 
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12

Sensitivity tuning of a bulk built-in current sensor for op..:

Dutertre, J.M. ; Possamai Bastos, R. ; Potin, O....
Microelectronics Reliability.  53 (2013)  9-11 - p. 1320-1324 , 2013
Link: https://doi.org/10.1016/..
 
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13

Novel transient-fault detection circuit featuring enhanced ..:

Possamai Bastos, R. ; Sill Torres, F. ; Di Natale, G...
Microelectronics Reliability.  52 (2012)  9-10 - p. 1781-1786 , 2012
Link: https://doi.org/10.1016/..
 
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14

The Living With a Star Space Environment Testbed Payload:

Dyer, Clive ; Ryden, Keith A ; Morris, Paul...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3239734.  , 2023
Link: https://hal.science/hal-..
 
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15

The Living With a Star Space Environment Testbed Payload:

Dyer, Clive ; Ryden, Keith A ; Morris, Paul...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3239734.  , 2023
Link: https://hal.science/hal-..
 
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