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Batenburg, K.J.
430  Ergebnisse:
Personensuche X
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1

Multiclass CBCT Image Segmentation for Orthodontics with De..:

Wang, H. ; Minnema, J. ; Batenburg, K.J....
Journal of Dental Research.  , 2021
Link: https://doi.org/10.1177/..
 
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2

Prototyping X-ray tomographic reconstruction pipelines with..:

Kostenko, A. ; Palenstijn, W.J. ; Coban, S.B....
SoftwareX.  11 (2020)  - p. 100364 , 2020
Link: https://doi.org/10.1016/..
 
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3

A geometric partitioning method for distributed tomographic..:

Buurlage, J.W. ; Bisseling, R.H. ; Batenburg, K.J.
Parallel Computing.  81 (2019)  - p. 104-121 , 2019
Link: https://doi.org/10.1016/..
 
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4

Optimizing experimental parameters for the projection requi..:

Aveyard, R. ; Zhong, Z. ; Batenburg, K.J..
Ultramicroscopy.  177 (2017)  - p. 84-90 , 2017
Link: https://doi.org/10.1016/..
 
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5

Pore REconstruction and Segmentation (PORES) method for imp..:

Van Eyndhoven, G. ; Kurttepeli, M. ; Van Oers, C.J....
Ultramicroscopy.  148 (2015)  - p. 10-19 , 2015
Link: https://doi.org/10.1016/..
 
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6

Quality bounds for binary tomography with arbitrary project..:

Fortes, W. ; Batenburg, K.J.
Discrete Applied Mathematics.  183 (2015)  - p. 42-58 , 2015
Link: https://doi.org/10.1016/..
 
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7

SDART: An algorithm for discrete tomography from noisy proj..:

Bleichrodt, F. ; Tabak, F. ; Batenburg, K.J.
Computer Vision and Image Understanding.  129 (2014)  - p. 63-74 , 2014
Link: https://doi.org/10.1016/..
 
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8

Advanced reconstruction algorithms for electron tomography:..:

Goris, B. ; Roelandts, T. ; Batenburg, K.J...
Ultramicroscopy.  127 (2013)  - p. 40-47 , 2013
Link: https://doi.org/10.1016/..
 
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9

Electron tomography based on a total variation minimization..:

Goris, B. ; Van den Broek, W. ; Batenburg, K.J...
Ultramicroscopy.  113 (2012)  - p. 120-130 , 2012
Link: https://doi.org/10.1016/..
 
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10

Accurate segmentation of dense nanoparticles by partially d..:

Roelandts, T. ; Batenburg, K.J. ; Biermans, E....
Ultramicroscopy.  114 (2012)  - p. 96-105 , 2012
Link: https://doi.org/10.1016/..
 
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11

Ultra-High Resolution Electron Tomography for Materials Sci..:

Batenburg, K ; Bals, S ; Van Aert, S..
Microscopy and Microanalysis.  17 (2011)  S2 - p. 934-935 , 2011
Link: https://doi.org/10.1017/..
 
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12

A semi-automatic algorithm for grey level estimation in tom..:

Batenburg, K.J. ; van Aarle, W. ; Sijbers, J.
Pattern Recognition Letters.  32 (2011)  9 - p. 1395-1405 , 2011
Link: https://doi.org/10.1016/..
 
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13

Performance improvements for iterative electron tomography ..:

Palenstijn, W.J. ; Batenburg, K.J. ; Sijbers, J.
Journal of Structural Biology.  176 (2011)  2 - p. 250-253 , 2011
Link: https://doi.org/10.1016/..
 
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14

Iterative correction of beam hardening artifacts in CT:

Van Gompel, G. ; Van Slambrouck, K. ; Defrise, M....
Medical Physics.  38 (2011)  S1 - p. S36-S49 , 2011
Link: https://doi.org/10.1118/..
 
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15

DART: a robust algorithm for fast reconstruction of three-d..:

Batenburg, K. J. ; Sijbers, J. ; Poulsen, H. F..
Journal of Applied Crystallography.  43 (2010)  6 - p. 1464-1473 , 2010
Link: https://doi.org/10.1107/..
 
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