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Baumann, Frieder H.
259  Ergebnisse:
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1

Towards Routine EDX Tomography in Semiconductor Failure Ana..:

Baumann, Frieder H. ; Popielarski, Brian ; Mitchell, Travis.
Microscopy and Microanalysis.  25 (2019)  S2 - p. 1820-1821 , 2019
Link: https://doi.org/10.1017/..
 
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2

How to Avoid Artifacts in Nanobeam Diffraction Strain Measu..:

Fu, B. ; Gribelyuk, M. ; Baumann, Frieder H..
Microscopy and Microanalysis.  23 (2017)  S1 - p. 1420-1421 , 2017
Link: https://doi.org/10.1017/..
 
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3

Spring-lattice model for fast, flexible and easy strain pre..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Baumann, Frieder H. ; Guinel, Maxime J-F - p. 198-200 , 2017
Link: https://doi.org/10.1109/..
 
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4

Advances in Elemental Electron Tomography for the State-of-..:

Fu, B. ; Gribelyuk, M ; Baumann, Frieder H....
Microscopy and Microanalysis.  23 (2017)  S1 - p. 1456-1457 , 2017
Link: https://doi.org/10.1017/..
 
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5

Characterization of VLSI Processing Defects Using STEM-EELS..:

Baumann, Frieder H. ; Miller, John ; Rhoads, Bryan..
Microscopy and Microanalysis.  22 (2016)  S3 - p. 280-281 , 2016
Link: https://doi.org/10.1017/..
 
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6

Practical Considerations in Quantitative Nanoscale Energy-D..:

Weng, Weihao ; Baumann, Frieder H. ; Ke, Yue...
Microscopy and Microanalysis.  21 (2015)  S3 - p. 1087-1088 , 2015
Link: https://doi.org/10.1017/..
 
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7

High precision two-dimensional strain mapping in semiconduc..:

Baumann, Frieder H.
Applied Physics Letters.  104 (2014)  26 - p. , 2014
Link: https://doi.org/10.1063/..
 
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8

Moisture Uptake Impact on Damage Layer of Porous Low-k Film..:

Tagami, Masayoshi ; Ogino, Atsushi ; Miyajima, Hideshi...
ECS Transactions.  41 (2011)  7 - p. 405-413 , 2011
Link: https://doi.org/10.1149/..
 
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9

Continuum model of thin film deposition incorporating finit..:

O'Sullivan, Peter L. ; Baumann, Frieder H. ; Gilmer, George H....
Journal of Applied Physics.  92 (2002)  7 - p. 3487-3494 , 2002
Link: https://doi.org/10.1063/..
 
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10

Simulation of physical vapor deposition into trenches and v..:

O'Sullivan, Peter L. ; Baumann, Frieder H. ; Gilmer, George H.
Journal of Applied Physics.  88 (2000)  7 - p. 4061-4068 , 2000
Link: https://doi.org/10.1063/..
 
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11

Mapping the composition of materials at the atomic level:

, In: Festkörperprobleme 31; Advances in Solid State Physics,
Ourmazd, Abbas ; Baumann, Frieder H. ; Bode, Michael. - p. 99-113 ,
Link: https://doi.org/10.1007/..
 
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12

Lattice Monte Carlo models of thin film deposition:

Gilmer, George H. ; Huang, Hanchen ; de la Rubia, Tomas Diaz..
Thin Solid Films.  365 (2000)  2 - p. 189-200 , 2000
Link: https://doi.org/10.1016/..
 
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13

Psychopathology and language behavior in schizophrenics:

Angermeyer, Matthias C. ; Timpe, Frieder H.
Archiv f�r Psychiatrie und Nervenkrankheiten.  228 (1980)  2 - p. 151-160 , 1980
Link: https://doi.org/10.1007/..
 
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14

Combine TEM with TCAD Simulation - A Novel Approach in Fail..:

Zhang, Yu ; Kodali, Satish ; Banghart, Edmund..
Microscopy and Microanalysis.  27 (2021)  S1 - p. 1548-1549 , 2021
Link: https://doi.org/10.1017/..
 
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15

Innovative Grounding Methodology for Epoxy Impregnated Semi..:

Baumann, Frieder ; Pichumani, Pradip Sairam ; Torcedo, Christopher
Microscopy and Microanalysis.  26 (2020)  S2 - p. 370-372 , 2020
Link: https://doi.org/10.1017/..
 
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