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Beckmann, Karsten
153  Ergebnisse:
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1

Optimization of the position of TaOx:N-based barrier layer ..:

Ravindra, Pramod ; Liehr, Maximilian ; Mathkari, Rajas...
Frontiers in Materials.  11 (2024)  - p. , 2024
Link: https://doi.org/10.3389/..
 
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2

Enhanced Computational Study with Experimental Correlation ..:

Sihn, Sangwook ; Chambers, William L. ; Abedin, Minhaz...
Small.  , 2024
Link: https://doi.org/10.1002/..
 
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3

Fcγ-Receptor-Independent Controlled Activation of CD40 Cano..:

Beckmann, Karsten ; Reitinger, Carmen ; Yan, Xianglei...
Antibodies.  13 (2024)  2 - p. 31 , 2024
Link: https://doi.org/10.3390/..
 
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4

Oxygen tracer diffusion in amorphous hafnia films for resis..:

Shin, Dongjae ; Ievlev, Anton V. ; Beckmann, Karsten...
Materials Horizons.  11 (2024)  10 - p. 2372-2381 , 2024
Link: https://doi.org/10.1039/..
 
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5

Three Programming States in Bilayer Ga–Sb Phase Change Memo..:

Gong, Haibo ; Ume, Rubab ; Tokranov, Vadim...
IEEE Transactions on Electron Devices.  70 (2023)  7 - p. 3511-3516 , 2023
Link: https://doi.org/10.1109/..
 
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6

Material to system-level benchmarking of CMOS-integrated RR..:

Abedin, Minhaz ; Gong, Nanbo ; Beckmann, Karsten...
Scientific Reports.  13 (2023)  1 - p. , 2023
Link: https://doi.org/10.1038/..
 
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7

Effect of Resistance variability in Vector Matrix Multiplic..:

, In: 2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS),
Solanki, Jeelka ; Beckmann, Karsten ; Pelton, Jacob.. - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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8

Analog NVM Synapse for Hardware-Aware Neural Network Traini..:

, In: 2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS),
Liehr, Maximilian ; Abedin, Minhaz ; Beckmann, Karsten. - p. 1-9 , 2023
Link: https://doi.org/10.1109/..
 
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9

Flow-Based Computing of NOR Logic Using ReRAM Devices:

, In: 2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS),
Woods, Zachery ; Cady, Nathaniel ; Liehr, Maximilian... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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10

Investigating Device Degradation and Revival in Resistive R..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Liehr, Maximilian ; Ravindra, Pramod ; Beckmann, Karsten. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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11

Failure Analysis of 65nm CMOS Integrated Nanoscale ReRAM De..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Liehr, Maximilian ; Hazra, Jubin ; Beckmann, Karsten. - p. 1-7 , 2022
Link: https://doi.org/10.1109/..
 
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12

Impact of Switching Variability, Memory Window, and Tempera..:

, In: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS),
Liehr, Maximilian ; Beckmann, Karsten ; Cady, Nathaniel - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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13

A Generalized Workflow for Creating Machine Learning-Powere..:

Hutchins, Jack ; Alam, Shamiul ; Zeumault, Andre...
IEEE Access.  10 (2022)  - p. 115513-115519 , 2022
Link: https://doi.org/10.1109/..
 
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14

Detecting Temporal Correlation on HfO2 Based RRAM on 65nm C..:

, In: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS),
Rafiq, Sarah ; Abedin, Minhaz ; Beckmann, Karsten. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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15

Exploring Model Stability of Deep Neural Networks for Relia..:

Krishnan, Gokul ; Yang, Li ; Sun, Jingbo...
IEEE Transactions on Computers.  71 (2022)  11 - p. 2740-2752 , 2022
Link: https://doi.org/10.1109/..
 
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