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Bedell, Stephen W.
217  Ergebnisse:
Personensuche X
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1

(Invited) Low-Temperature Growth of Strained Germanium Quan..:

Bedell, Stephen W. ; Hart, Sean ; Bangsaruntip, Sarunya...
ECS Transactions.  98 (2020)  5 - p. 215-224 , 2020
Link: https://doi.org/10.1149/..
 
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2

Diffusion-Controlled Porous Crystalline Silicon Lithium Met..:

Collins, John ; de Souza, Joel P. ; Hopstaken, Marinus...
iScience.  23 (2020)  10 - p. 101586 , 2020
Link: https://doi.org/10.1016/..
 
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3

Flexible Piezoresistive Sensors Fabricated by Spalling Tech..:

, In: 2018 International Flexible Electronics Technology Conference (IFETC),
Sakuma, Katsuyuki ; Hu, Huan ; Bedell, Stephen W.... - p. 1 - 2 , 2018
Link: https://doi.org/10.1109/..
 
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4

Rapid imaging of misfit dislocations in SiGe/Si in cross-se..:

Mukherjee, Kunal ; Wacaser, Brent A. ; Bedell, Stephen W..
Applied Physics Letters.  110 (2017)  23 - p. , 2017
Link: https://doi.org/10.1063/..
 
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5

Stress determination through diffraction: establishing the ..:

Murray, Conal E. ; Jordan-Sweet, Jean L. ; Bedell, Stephen W..
Powder Diffraction.  30 (2015)  2 - p. 99-103 , 2015
Link: https://doi.org/10.1017/..
 
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6

(Invited) Gate Stacks for Silicon, Silicon Germanium, and I..:

Frank, Martin M. ; Zhu, Yu ; Bedell, Stephen W...
ECS Transactions.  61 (2014)  2 - p. 213-223 , 2014
Link: https://doi.org/10.1149/..
 
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7

(Invited) Cost-Effective Layer Transfer by Controlled Spall..:

Bedell, Stephen W. ; Shahrjerdi, Davood ; Fogel, Keith...
ECS Transactions.  50 (2013)  7 - p. 315-323 , 2013
Link: https://doi.org/10.1149/..
 
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8

Layer-Resolved Graphene Transfer via Engineered Strain Laye..:

Kim, Jeehwan ; Park, Hongsik ; Hannon, James B....
Science.  342 (2013)  6160 - p. 833-836 , 2013
Link: https://doi.org/10.1126/..
 
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9

(Invited) Microstructure Development in Epitaxially Grown I..:

Reznicek, Alexander ; Adam, Thomas N ; Li, Jinghong...
ECS Transactions.  50 (2013)  9 - p. 1013-1024 , 2013
Link: https://doi.org/10.1149/..
 
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10

Aggressive SiGe Channel Gate Stack Scaling by Remote Oxygen..:

Frank, Martin M. ; Cartier, Eduard A. ; Ando, Takashi...
ECS Transactions.  50 (2013)  4 - p. 275-280 , 2013
Link: https://doi.org/10.1149/..
 
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11

Layer transfer by controlled spalling:

Bedell, Stephen W ; Fogel, Keith ; Lauro, Paul...
Journal of Physics D: Applied Physics.  46 (2013)  15 - p. 152002 , 2013
Link: https://doi.org/10.1088/..
 
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12

Weighted mechanical models for residual stress determinatio..:

Murray, Conal E. ; Bedell, Stephen W. ; Ryan, E. Todd
Journal of Applied Physics.  114 (2013)  3 - p. , 2013
Link: https://doi.org/10.1063/..
 
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13

Observation of semiconductor device channel strain using in..:

Holt, Judson R. ; Madan, Anita ; Harley, Eric C. T....
Journal of Applied Physics.  114 (2013)  15 - p. , 2013
Link: https://doi.org/10.1063/..
 
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14

Vertical Light-Emitting Diode Fabrication by Controlled Spa..:

Bedell, Stephen W. ; Bayram, Can ; Fogel, Keith...
Applied Physics Express.  6 (2013)  11 - p. 112301 , 2013
Link: https://doi.org/10.7567/..
 
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15

(Invited) New Paradigms for Cost-Effective III-V Photovolta..:

Shahrjerdi, Davood ; Bedell, Stephen W. ; Hekmatshoar, Bahman..
ECS Transactions.  50 (2013)  40 - p. 15-22 , 2013
Link: https://doi.org/10.1149/..
 
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