Beleniotis, Petros
9  Ergebnisse:
Personensuche X
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2

Investigation of Traps Impact on PAE and Linearity of AlGaN..:

Beleniotis, Petros ; Zervos, Christos ; Krause, Sascha...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3582-3589 , 2024
 
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4

A Physics-Based Model for Slow Gate-Induced Electron Trappi..:

Beleniotis, Petros ; Krause, Sascha ; Zervos, Christos.
IEEE Transactions on Electron Devices.  71 (2024)  7 - p. 4058-4065 , 2024
 
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5

The role of gate leakage on surface-related current collaps..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
 
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6

Dynamic RD Modeling by Exploiting Gate Current Dependency o..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
 
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7

Localization of Trapping Effects in GaN HEMTs with Pulsed S..:

, In: 2022 17th European Microwave Integrated Circuits Conference (EuMIC),
 
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8

On the Influence of Transistor Dimensions on the Dispersive..:

, In: 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022,
 
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9

An efficient drain-lag model for microwave GaN HEMTs based ..:

Beleniotis, Petros ; Schnieder, Frank ; Krause, Sascha..
International Journal of Microwave and Wireless Technologies.  14 (2021)  2 - p. 134-142 , 2021
 
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