Berquez, Laurent
86  Ergebnisse:
Personensuche X
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3

Space Charge Characterization in Insulating Materials used ..:

, In: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE),
 
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4

Space Charge Measurement by PEA Method on an Aeronautical C..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
 
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5

(F)LIMM deconvolution procedure for on-line measurements of..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
 
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8

Editorial: Electrostatics:

Berquez, Laurent ; Notingher, Petru
IEEE Transactions on Dielectrics and Electrical Insulation.  23 (2016)  2 - p. 613-613 , 2016
 
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9

Special issue of the IEEE Transactions on Dielectrics and E..:

Berquez, Laurent ; Notingher, Petru
IEEE Transactions on Dielectrics and Electrical Insulation.  22 (2015)  1 - p. 635-635 , 2015
 
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10

Defect Detection in Silicon Wafer by Photoacoustic Imaging:

Berquez, Laurent ; Marty-Dessus, Didier ; Franceschi, Jean L.
Japanese Journal of Applied Physics.  42 (2003)  Part 2, No. 10A - p. L1198-L1200 , 2003
 
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12

Modeling and characterization of transducers for thermoacou..:

Berquez, Laurent ; Franceschi, Jean-Luc
Sensors and Actuators A: Physical.  69 (1998)  2 - p. 115-120 , 1998
 
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