Wusten, Caroline ;
Schlier, Bjorn ;
Jaya, Edo S...
Wusten , C , Schlier , B , Jaya , E S , Alizadeh , B Z , Bartels-Velthuis , A A , van Beveren , N J , Bruggeman , R , Cahn , W , de Haan , L , Delespaul , P , Meijer , C J , Myin-Germeys , I , Kahn , R S , Schirmbeck , F , Simons , C J P , van Haren , N E , van Os , J , van Winkel , R , Fonseca-Pedrero , E , Peters , E , Verdoux , H , Woodward , T S , Ziermans , T B , Lincoln , T M & Genetic Risk and Outcome of Psychosis (GROUP) Investigators 2018 , ' Psychotic Experiences and Related Distress : A Cross-national Comparison and Network Analysis Based on 7141 Participants From 13 Countries ' , Schizophrenia Bulletin , vol. 44 , no. 6 , pp. 1185-1194 . https://doi.org/10.1093/schbul/sby087.
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2018