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Biberger, Roland
7  Ergebnisse:
Personensuche X
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1

Scanning probe microscopy based electrical characterization..:

Hofer, Alexander ; Biberger, Roland ; Benstetter, Günther..
Microelectronics Reliability.  53 (2013)  9-11 - p. 1430-1433 , 2013
Link: https://doi.org/10.1016/..
 
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2

Analysis of crystal defects on GaN-based semiconductors wit..:

Hofer, Alexander ; Benstetter, Günther ; Biberger, Roland..
Thin Solid Films.  544 (2013)  - p. 139-143 , 2013
Link: https://doi.org/10.1016/..
 
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3

Intermittent-contact capacitance spectroscopy – A new metho..:

Biberger, Roland ; Benstetter, Guenther ; Goebel, Holger.
Microelectronics Reliability.  50 (2010)  9-11 - p. 1511-1513 , 2010
Link: https://doi.org/10.1016/..
 
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4

Displacement current sensor for contact and intermittent co..:

Biberger, Roland ; Benstetter, Guenther ; Goebel, Holger
Microelectronics Reliability.  49 (2009)  9-11 - p. 1192-1195 , 2009
Link: https://doi.org/10.1016/..
 
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5

A review of advanced scanning probe microscope analysis of ..:

Benstetter, Günther ; Biberger, Roland ; Liu, Dongping
Thin Solid Films.  517 (2009)  17 - p. 5100-5105 , 2009
Link: https://doi.org/10.1016/..
 
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6

Intermittent-contact scanning capacitance microscopy versus..:

Biberger, Roland ; Benstetter, Guenther ; Schweinboeck, Thomas..
Microelectronics Reliability.  48 (2008)  8-9 - p. 1339-1342 , 2008
Link: https://doi.org/10.1016/..
 
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7

Entwicklung und Optimierung dynamischer Methoden der Raster..:

Biberger, Roland , 2012
Link: http://nbn-resolving.de/..
 
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